X-ray Calibration Tool Deformation Compensation

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Solution Overview

Problem

X-ray measuring devices face accuracy issues due to deformation of calibration tools over time, which affects the precision of dimension measurements.

Innovation Solution

A calibration method for X-ray measuring devices that calculates the rotation center position of a rotating table by using a calibration tool with reference objects, involving steps like mounting reference objects at specific intervals, calculating relative positional intervals, and determining transformation matrices to account for deformation, allowing for accurate positioning even when the calibration tool is deformed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a calibration tool is used for device calibration, then measurement accuracy can be improved, but the calibration tool may deform due to secular change causing measurement accuracy to deteriorate

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidcalibration tool stability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent creates multiple virtual copies of reference objects through image processing. By generating projected images of reference objects at different positions and creating virtual copies, the system can calculate relative positional intervals without relying on the physical integrity of the calibration tool. This allows accurate measurement even when the physical tool deforms, as the virtual copies preserve the geometric relationships needed for calibration.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent replaces reliance on the physical mechanical structure of the calibration tool with an image-based computational system. By using X-ray projected images and image processing algorithms to determine positional relationships, the system substitutes the mechanical calibration tool's physical dimensions with digital image data, eliminating the problem of physical deformation affecting measurements.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If multiple reference objects are positioned at specific intervals on a rotating table, then rotation center position can be calculated, but the process becomes complex when accounting for tool deformation

Engineering Contradiction:
Improverotation center position accuracyVSAvoidcalibration process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the calibration process into distinct image processing steps: acquiring projected images at different rotation positions, creating virtual copies of reference objects, calculating relative positional intervals from image data, and finally computing the rotation center. This segmentation simplifies the overall process by breaking down the complex deformation compensation into manageable image processing tasks rather than requiring complex mechanical adjustments.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates virtual copies of reference objects from projected images at different rotation positions. By generating these digital copies and calculating their relative positional intervals through image processing, the system determines the rotation center position without needing to physically measure or account for tool deformation, thereby simplifying the calibration process while maintaining accuracy.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the calculation of the rotation center position with a simple and efficient process, maintaining measurement accuracy despite tool deformation, thereby improving the reliability of dimension measurements.

Implementation Method 1

an X-ray source that generates an X-ray

Methodology Applied
Scientific EffectX-ray generation: X-Ray

Implementation Method 2

an X-ray image detector that detects the X-ray passing through the object to be measured

Methodology Applied
Scientific EffectX-ray detection: Photoelectric Effect

Data Source

PatentUS11344276B2Calibration method of x-ray measuring device
Publication Date: 2022.05.31 MITUTOYO CORP
  • US11344276B2 patent drawing
  • US11344276B2 patent drawing
  • US11344276B2 patent drawing

AI summary

A calibration method of an X-ray measuring device includes: mounting a calibration tool 102 on a rotating table 120; a moving position acquisition step of parallelly moving a position of an j-th sphere 106 with respect to a position of a first sphere 106, irradiating the calibration tool 102 with an X-ray 118, and acquiring, form an output of an X-ray image detector 124, a moving position Mj where the magnitude of a differential position Erjofa centroid position ImDisjh_Sphr_j of a projected image of the j(2£j£N)-th sphere 106 with respect to a centroid position ImDis1_Sphr_1 of a projected image of the first sphere 106 becomes equal to or less than a specified value Vx; a relative position calculation step of performing the moving position acquisition step on the remaining spheres; a feature position calculation step; a transformation matrix calculation step; a rotation detection step; a position calculation step; and a center position calculation step.