X-ray Collimator Design for Rapid Bragg Diffraction Overlap
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Solution Overview
Problem
Current X-ray crystallography techniques are slow and require special sample preparation, making them unsuitable for real-time or on-line inspection applications, particularly for large samples, and struggle with detecting materials with low thickness, such as sheet explosives.
Innovation Solution
A radiation detecting apparatus comprising a collimator and detector, where the collimator allows transmission of radiation through specific regions, enabling Bragg diffracted radiation to overlap at the detector, facilitating faster data collection and material identification without special sample preparation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional powder diffractometers are used for X-ray crystallography, then material structure analysis is achieved, but data collection time is long and sample preparation is required
Solution Approach 1:
The patent transitions from conventional 1D scanning detection to 2D area detector detection, capturing diffraction patterns in a two-dimensional plane simultaneously. This dimensional change enables parallel measurement of multiple diffraction angles at once, dramatically reducing data collection time while maintaining structural analysis precision
Solution Approach 2:
The patent employs continuous X-ray beam irradiation combined with 2D area detectors to capture diffraction patterns without interruption. The system maintains continuous useful action by simultaneously measuring diffraction intensities across multiple angles, eliminating the step-by-step scanning process and significantly reducing total measurement time
2Productivity
If conventional X-ray absorption imaging is used, then real-time inspection is possible, but material identification accuracy is low
Solution Approach 1:
The patent replaces the mechanical scanning process of conventional diffractometers with a stationary 2D area detector that captures diffraction patterns instantaneously. This substitution enables real-time inspection by eliminating mechanical movement time while maintaining the high accuracy of diffraction-based material identification
3Measurement precision
If conventional diffractometers scan diffraction patterns, then material structure is determined, but the process is slow and not suitable for on-line inspection
Solution Approach 1:
The patent uses 2D area detectors to capture diffraction patterns in a two-dimensional plane simultaneously, replacing conventional 1D scanning. This dimensional expansion allows parallel measurement of multiple diffraction angles at once, achieving both high structural analysis accuracy and rapid data collection suitable for on-line inspection
4Measurement precision
If X-ray crystallography is used for material identification, then precise material characteristics are obtained, but special sample preparation is required
Solution Approach 1:
The patent employs a universal 2D area detector system that can analyze various sample types (powders, crystals, thin films) without requiring special preparation. The system's multi-functionality allows it to handle different sample forms while maintaining precise material characteristic determination, eliminating the need for specialized sample preparation procedures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces data collection time, enhances material identification accuracy, and allows for the inspection of large samples by overlapping Bragg scattered radiation at multiple locations, improving detection of materials with low thickness.
Implementation Method 1
the Bragg diffracted radiation/Debye cone from the crystal material at two or more and preferably all of the plurality of locations overlap at the detector
Implementation Method 2
A small portion of a primary X-ray beam incident onto a crystal is scattered at measurable angles if its wavelength is similar to the lattice distances (or d-spacing) present in the crystalline material under inspection
Data Source
Figure 1
Figure 2a~2c
Figure 3
AI summary
Radiation detecting apparatus comprising a collimator and a detector, the collimator comprising a material for blocking radiation and a region that is a sector of an annulus or a plurality of regions in a configuration in the shape of a sector of an annulus for allowing transmission of said radiation, the detector being spaced a distance from the collimator such that when a radiation source and sample comprising a crystal material, are positioned at suitable positions the radiation is collimated by the collimator and contacts the sample a predetermined distance from the detector at a plurality of locations corresponding to the region or regions of the collimator, and the Bragg diffracted radiation from the crystal material at two or more and preferably all of the plurality of locations overlap at the detector.