X-ray Contrast Control via Dynamic Beam Filter Adjustment

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Solution Overview

Problem

Current X-ray inspection systems lack the ability to effectively control image contrast, particularly for detecting threats hidden behind metal obscurants, which hinders the operator's ability to identify contraband and optimize scanning throughput.

Innovation Solution

An X-ray inspection system with multiple beam filters of varying thicknesses, where the position of these filters can be adjusted based on user input to achieve desired contrast levels, combined with nonlinear transfer functions for image processing to enhance contrast and edge detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If beam filters are used to reduce radiation dose and remove low energy photons, then radiation dose is reduced and image noise is decreased, but image contrast is reduced making it difficult to detect threats behind metal obscurants

Engineering Contradiction:
Improveradiation doseVSAvoidimage contrast
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The system dynamically switches between different beam filter configurations based on inspection needs. Multiple beam filters with different thicknesses and materials are employed, allowing the system to adjust the beam spectrum in real-time to optimize both dose reduction and contrast enhancement for different inspection scenarios

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes physical parameters of the X-ray beam by using different beam filters with varying thicknesses and materials (e.g., aluminum, copper, tin). This allows modification of the beam energy spectrum to achieve optimal contrast for detecting threats behind metal obscurants while maintaining dose reduction benefits

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If beam filters are used to enhance image contrast for threat detection, then detectability of threats behind metal is improved, but radiation dose increases and scanning throughput decreases

Engineering Contradiction:
Improvethreat detectabilityVSAvoidscanning throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The system applies beam filtration selectively and partially - using only the necessary filter thickness and material composition required to achieve adequate contrast for threat detection, rather than applying excessive filtration that would unnecessarily reduce throughput. The system finds the optimal balance point where sufficient contrast is achieved with minimal impact on scanning speed

Inventive Principle:
Principle #16Partial or excessive action

3Adaptability or versatility

If multiple beam filters of varying thicknesses are implemented to provide contrast control, then image contrast adjustment capability is improved, but device complexity increases

Engineering Contradiction:
Improvecontrast control capabilityVSAvoidsystem complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The multiple beam filters serve multiple functions simultaneously: they provide contrast adjustment capability, optimize beam spectrum for different inspection scenarios, reduce radiation dose, and enhance detectability of various threat types. This multi-functionality justifies the added complexity by delivering comprehensive performance improvements across multiple parameters

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances the detectability of threats by optimizing image contrast, allowing operators to adjust settings for improved detection quality and throughput while reducing radiation dose and noise.

Implementation Method 1

A beam filter limits the overall dose of the X-ray beam by limiting the flux and the lowest energy portion of the X-ray beam spectrum

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Implementation Method 2

an X-ray source configured to generate an X-ray beam for irradiating the object

Methodology Applied
Scientific EffectX-Ray: X-Ray

Implementation Method 3

a detector array adapted to receive radiation, originating from the X-ray beam, that is transmitted through, or scattered from, the object and to generate data representative of at least one image

Methodology Applied
Scientific EffectDetection of radiation: Photoelectric Effect

Data Source

PatentUS11193898B1Systems and methods for controlling image contrast in an X-ray system
Publication Date: 2021.12.07 AMERICAN SCIENCE & ENGINEERING INC
  • US11193898B1 patent drawing
  • US11193898B1 patent drawing
  • US11193898B1 patent drawing

AI summary

An X-ray inspection system for scanning objects and providing corresponding contrast controlled scan images is provided. The system includes an X-ray source configured to generate an X-ray beam for irradiating the object where the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness, a detector array, a processing unit, a user interface configured to receive a user input indicative of a desired level of contrast in an image, and a controller configured to adjust a position of at least one of the first or second beam filters based on the user input indicative of the desired level of contrast in the at least one image.