X-ray CT Image Correction via Multi-Source Fusion
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Solution Overview
Problem
The dimensional accuracy of X-ray CT images is compromised due to the difficulty in determining threshold values between dissimilar materials or between objects and air, particularly when representing curved surfaces, as current X-ray focal point sizes and detector pixel sizes are limited, leading to unclear edges in three-dimensional modeling.
Innovation Solution
An image acquisition device utilizing a combination of micro and nano X-ray sources with corresponding detectors, employing a maximum likelihood estimation and expectation maximization reconstruction method to correct the micro X-ray source images based on nano X-ray source images, enhancing the accuracy of internal and external contour representation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the physical performances of the X-ray focal point size and the number of pixels of the detector are increased to improve measurement accuracy, then the dimensional accuracy and edge clarity improve, but the device complexity and cost increase significantly
Solution Approach 1:
The patent combines images from multiple X-ray sources with different focal point sizes into a single synthesized image. The image synthesis unit merges the micro X-ray source image and nano X-ray source image, leveraging the strengths of each source to achieve high measurement accuracy without requiring a single complex high-performance detector
Solution Approach 2:
The patent introduces an image synthesis unit as an intermediary that processes and combines images from different X-ray sources. This mediator integrates the information from micro and nano sources, producing a final image with enhanced dimensional accuracy without directly upgrading the physical detector components
2Measurement precision
If a single high-resolution detector is used to improve edge clarity, then the measurement accuracy improves, but the ability to penetrate heavy metals and thick samples deteriorates
Solution Approach 1:
The patent segments the imaging function across multiple X-ray sources with different characteristics. The micro X-ray source handles samples requiring penetration (heavy metals, thick samples) while the nano X-ray source handles samples requiring high edge clarity. This segmentation allows each source to operate in its optimal performance range
Solution Approach 2:
The patent changes the parameter of X-ray focal point size by using multiple sources with different focal point sizes (micro and nano). This parameter variation allows the system to adapt to different sample types and requirements, achieving both penetration capability and edge clarity through image synthesis
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach improves the accuracy of three-dimensional modeling by correcting the micro X-ray source images to match the highly accurate nano X-ray source images, reducing artifacts and blurring, and enabling the creation of precise internal and external contours.
Implementation Method 1
a micro X-ray source 10 which applies X-rays having a focal point size of 1 µm to 1 mm... a nano X-ray source 40 which applies X-rays having a focal point size of 1 to 800 nm
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition device 1 includes: a first X-ray source 10 that applies X-rays having a first focal point size; a first detector 20 that detects X-rays applied from the first X-ray source 10 and having passed through a measured object O; a first image generation means 30 that generates a first X-ray CT image on the basis of the X-rays detected by the first detector 20; a second X-ray source 40 that applies X-rays having a second focal point size smaller than the first focal point size; a second detector 50 that detects X-rays applied from the second X-ray source and having passed through the measured object 0; a second image generation means 60 that generates a second X-ray CT image on the basis of the X-rays detected by the second detector 50; and an image correction means 70 that corrects the first X-ray CT image generated by the first image generation means 30 on the basis of the second X-ray CT image generated by the second image generation means 60.