X-ray Apparatus Deflection Correction via Position Feedback
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Solution Overview
Problem
Existing X-ray apparatuses face challenges in achieving accurate magnification due to deflection in the mounting table caused by varying weights of test specimens, leading to inconsistencies in measurement.
Innovation Solution
An X-ray apparatus with a mounting unit, X-ray generation unit, X-ray detector, movement units, position detection, and calculation units that correct for deflection by using proximity detection and deflection detection to calculate accurate magnification, and optionally employs marks for magnification measurement and contact detection to ensure precise positioning and minimize movement errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a mounting table is used to hold test specimens of varying weights, then the apparatus can accommodate different specimens, but the mounting table deflects due to weight variations, leading to inaccurate magnification measurements
Solution Approach 1:
The system uses a position detection unit to continuously monitor the actual position of the mounting table and provides feedback to a calculation unit. The calculation unit then computes corrected magnification values based on the detected positional deviations, enabling accurate measurements despite table deflection caused by varying specimen weights.
Solution Approach 2:
The patent replaces direct mechanical measurement of magnification with an optical/electrical detection system. Instead of relying on mechanical stability alone, the system uses a position detection unit (optical or electrical sensors) to detect mounting table position and a calculation unit to compute corrected magnification, substituting mechanical precision requirements with computational correction.
2Measurement precision
If the mounting table is made more rigid to prevent deflection, then measurement accuracy improves, but the complexity and cost of the apparatus increases
Solution Approach 1:
Rather than increasing mechanical rigidity, the system implements a feedback mechanism using position detection units to monitor mounting table position and calculation units to compute corrected magnification values, achieving measurement accuracy through software correction rather than hardware reinforcement.
Solution Approach 2:
The patent introduces an intermediary computational system between the physical mounting table and the measurement process. The position detection unit and calculation unit act as intermediaries that detect and correct for table deflection, allowing a simpler, more flexible mounting structure to achieve high measurement accuracy.
3Measurement precision
If proximity detection and contact detection units are added to detect deflection, then magnification calculation accuracy improves, but the device complexity increases
Solution Approach 1:
The position detection unit serves multiple functions: it detects the relative position of the mounting table for magnification calculation, detects proximity between the mounting table and X-ray source, and detects actual contact between components. This multi-functionality reduces the need for separate detection systems, balancing accuracy improvement with controlled complexity increase.
Solution Approach 2:
The patent combines proximity detection and contact detection functions into a unified position detection system. The same detection unit that measures position for magnification calculation also detects proximity and contact conditions, merging multiple detection functions into a single integrated system to minimize complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate calculation of magnification even with deflection, preventing positional deviations and enhancing measurement accuracy by correcting for deflection-induced errors and ensuring precise contact detection.
Implementation Method 1
an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, towards the object to be measured
Implementation Method 2
an X-ray detector that acquires a transmission image of the object to be measured that is being irradiated by the X-rays
Data Source
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AI summary
An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.