Flat Panel X-ray Detector Light Absorption Units
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Solution Overview
Problem
X-ray flat panel detectors suffer from reduced image accuracy due to excessive light reflections in the Scintillation layer, which affects the sharpness and accuracy of detected images.
Innovation Solution
The X-ray flat panel detector design incorporates a thin film transistor substrate, a photoelectric detecting layer with light absorption units, a Scintillation layer, and a reflective layer, optionally with a carbon fiber layer or micro-lens array, to minimize light reflections and improve image accuracy by absorbing or redirecting visible light effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If a reflective layer is added to improve light utilization, then light absorption efficiency is improved, but light reflection times increase causing image blur
Solution Approach 1:
The patent applies local quality by creating different optical properties in different regions: light absorption units are placed specifically in gap regions between pixel electrodes to absorb stray light, while the pixel regions maintain reflective properties for light collection. This localized differentiation resolves the contradiction by allowing reflection where needed for efficiency while preventing harmful reflections in gap regions that would degrade image quality.
2Measurement precision
If light absorption units are added to reduce light reflections, then image accuracy is improved, but device complexity increases
Solution Approach 1:
The patent merges the light absorption function with the existing gap structure between pixels. The light absorption units are integrated into the gap regions rather than being separate components, combining the structural element (gap) with a functional element (light absorption) to reduce overall device complexity while maintaining the benefit of reduced light reflection.
Solution Approach 2:
The gap regions between pixels serve multiple functions: they provide electrical isolation between pixels and now also serve as locations for light absorption units. This multi-functionality reduces the need for additional separate components, thereby limiting the increase in device complexity while achieving improved image accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces light reflections, enhances image sharpness, and improves detection accuracy by preventing optical signal shifts and distortions, resulting in clearer and more precise digital radiography images.
Implementation Method 1
the light absorption units are disposed in gaps between adjacent photoelectric detecting units
Implementation Method 2
the visible light signals are reflected by the metal wires and reflected back to the photoelectric detecting layer through a reflective layer
Implementation Method 3
converting X-rays into visible light signals through a Scintillation layer (Scintillator)
Implementation Method 4
converting the visible light signals into electrical signals via a photoelectric detecting layer
Data Source
AI summary
The present invention relates to a flat panel X-ray detector, which comprises a thin film transistor (TFT) substrate; a photoelectric detecting layer, which is disposed on and electrically connected with the TFT substrate, wherein the photoelectric detecting layer comprises a plurality of photoelectric detecting units and a plurality of light absorption units, and the light absorption unit is disposed between spaces adjacent to the photoelectric detecting unit; a Scintillation layer, which is disposed on the photoelectric detecting layer; and a reflective layer, which is disposed on the Scintillation layer.