X-ray Detector Misalignment Determination Using Image Shift Analysis
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Solution Overview
Problem
Current semiconductor X-ray detectors face challenges in large-area and high-pixel production due to cumbersome heat management, making it difficult to achieve accurate alignment between multiple detectors, which affects their performance in imaging applications.
Innovation Solution
A method is disclosed to determine misalignment between X-ray detectors by obtaining and comparing images from aligned and misaligned configurations, using a combination of X-ray absorption layers and electronics systems with voltage comparators and controllers to analyze shifts and voltage changes, allowing for precise alignment and improved spatial resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple X-ray detectors are stacked to improve absorption efficiency, then X-ray absorption efficiency is improved, but alignment precision deteriorates due to heat management issues
Solution Approach 1:
The patent applies preliminary action by performing alignment calibration before actual X-ray imaging operations. The system captures calibration images at known positions to establish reference data, which is then used to correct subsequent imaging measurements. This preliminary calibration step compensates for alignment issues that arise during operation, allowing multiple detectors to be stacked for improved absorption while maintaining precision through pre-established reference frames.
Solution Approach 2:
The patent implements feedback mechanisms by continuously monitoring detector positions and comparing actual imaging data against calibration references. The system uses the captured images to detect misalignment and applies correction algorithms to compensate for positional drift. This closed-loop feedback ensures that even when detectors are stacked and subject to thermal expansion or mechanical drift, the system can maintain alignment precision through real-time corrections.
2Area of stationary object
If large-area detectors with many pixels are produced to improve imaging coverage, then imaging coverage is improved, but heat management becomes cumbersome making production difficult
Solution Approach 1:
The patent applies segmentation by dividing the large-area detector into multiple smaller detector modules or pixels that can be manufactured independently and then assembled into a larger array. This modular approach allows each small detector to be produced with standard heat management techniques, avoiding the cumbersome thermal challenges of building a single large detector. The segmented modules are then calibrated together using the image-based alignment method to achieve precise large-area imaging coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate alignment of X-ray detectors, enhancing their spatial resolution and absorption efficiency, thereby improving the quality of X-ray imaging without the need for bulky cooling mechanisms.
Implementation Method 1
A semiconductor X-ray detector may include a semiconductor layer that absorbs X-ray in wavelengths of interest. When an X-ray photon is absorbed in the semiconductor layer, multiple charge carriers (e.g., electrons and holes) are generated
Implementation Method 2
a first voltage comparator configured to compare a voltage of the electrode to a first threshold; a second voltage comparator configured to compare the voltage to a second threshold
Data Source
AI summary
Disclosed herein is a method comprising: obtaining a third image from a first X-ray detector when the first X-ray detector and a second X-ray detector are misaligned; determining, based on a shift between a first image and the third image, a misalignment between the first X-ray detector and the second X-ray detector when the first and second detectors are misaligned; wherein the first image is an image the first X-ray detector should capture if the first and the second detectors are aligned.