X-ray detector modules with overlapping active zones
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Solution Overview
Problem
Existing X-ray diffraction measuring arrangements face challenges in obtaining complete one-dimensional measurement information efficiently, as they often result in gaps due to dead zones around active detector modules, requiring time-consuming module movement to cover larger measurement ranges.
Innovation Solution
The measuring arrangement features overlapping detector modules along a circular arc, where active zones of adjacent modules overlap in the measuring direction, ensuring continuous data collection without gaps, even in areas where one module's dead zone is covered by another's active zone, allowing for precise and complete diffraction information capture.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If detector modules are arranged one after another with dead zones between them, then the device complexity is reduced, but measurement gaps occur in the dead zone areas
Solution Approach 1:
The patent transitions from linear arrangement to circular arc arrangement of detector modules. By positioning modules along a circular arc centered on the sample, the active zones can overlap in the radial direction while maintaining separation in the tangential direction, eliminating measurement gaps without increasing device complexity
Solution Approach 2:
The patent merges the coverage areas of adjacent detector modules by arranging them overlapping along a circular arc. The active zones of neighboring modules overlap in the radial direction to ensure continuous coverage, combining their detection capabilities to eliminate dead zone gaps
2Adaptability or versatility
If detector modules are moved to cover larger measurement ranges, then the measurement range is extended, but the measurement time increases
Solution Approach 1:
The patent performs preliminary action by pre-positioning multiple detector modules along a circular arc to cover a large measurement range simultaneously. This eliminates the need for time-consuming movement during measurement, as all required detection positions are already in place
Solution Approach 2:
The patent uses a static circular arc arrangement that inherently provides adaptability for large measurement ranges without requiring dynamic movement. The geometric configuration allows the system to maintain versatility while eliminating time loss associated with module relocation
3Device complexity
If one-dimensional spatial resolution is used, then the device complexity is reduced, but complete diffraction information cannot be obtained due to dead zones
Solution Approach 1:
The patent applies curvature by arranging detector modules along a circular arc rather than a straight line. This curved configuration allows the active zones to overlap continuously in the radial direction, ensuring complete diffraction information capture while maintaining one-dimensional spatial resolution and simple device structure
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables quick and complete acquisition of one-dimensional measurement data with reduced measurement errors and equipment complexity, facilitating efficient diffraction analysis without the need for extensive module movement.
Implementation Method 1
X-rays are diffracted by the lattice planes of the crystals in the sample or by the corresponding atoms. The spatial distribution of the diffracted X-rays can be used to determine the crystal structure or properties of the sample under investigation.
Implementation Method 2
an X-ray detector for detecting the X-ray radiation emanating from the sample position, comprising several detector modules, wherein the detector modules each have at least one active zone in which X-radiation can be detected
Data Source
Figure 1~3
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AI summary
The present invention relates to an x-ray detector (21) having a plurality of detector modules (1, 1a-1g), each comprising dead zones (6) without x-ray sensitivity and active zones (3, 3a-3c) having x-ray sensitivity, which is spatially resolved in a measurement direction (MR), wherein the detector modules (1, 1a-1g) are designed to be successive and overlapping along the measurement direction (MR), such that, in overlapping regions (23a-23e), the dead zone (6) of a detector module (1, 1a-1g) is bridged by an active zone (3, 3a-3c) of another detector module (1, 1a-1g). The overlapping detector modules (1, 1a-1g) are arranged adjacent to one another in the transverse direction (QR) in the overlapping regions (23a-23e), wherein the transverse direction (QR) extends crosswise to the local measurement direction (MR) and crosswise to a local connection direction (VR) to a sample position (91). A gapless, one-dimensional piece of measurement information, particularly x-ray diffraction information, can be easily obtained by the x-ray detector (21) from a measurement sample (96) at the sample position (91).