X-Ray Detector Re-Binning for High-Resolution Diffraction Data
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Solution Overview
Problem
Existing X-ray analysis methods using large, flat-faced detectors face challenges in accurately combining data from unevenly spaced detection channels, leading to errors in resolution and quality of analysis results, particularly when the angular size of the detector exceeds 10 degrees.
Innovation Solution
A computer-implemented method and apparatus that account for the angular offset of each detection channel relative to a reference channel, re-bin the intensity data into evenly spaced detection angle bins, and calculate intensity contribution factors to generate high-resolution X-ray analysis data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a large, flat-faced X-ray detector with multiple detection channels is used to speed up data acquisition, then productivity is improved, but measurement precision deteriorates due to unevenly spaced detection channels causing errors in resolution
Solution Approach 1:
The detector data is segmented into multiple detection channels, each with its own angular offset. The method processes each channel separately by determining individual angular offsets and intensity contribution factors, then combines the results to maintain high resolution while utilizing all channels for fast data acquisition.
Solution Approach 2:
The method changes the parameter representation by introducing angular offset corrections and intensity contribution factors for each detection channel. By adjusting these parameters during data processing, the system compensates for the uneven spacing of detection channels and restores measurement precision while maintaining the productivity benefits of using multiple channels.
2Device complexity
If intensity data from multiple detection channels is combined without accounting for angular offsets, then device complexity is reduced, but manufacturing precision deteriorates due to errors in resolving diffraction peaks
Solution Approach 1:
The method performs preliminary actions by pre-determining the angular offset for each detection channel and calculating intensity contribution factors before combining the data. This preparatory processing ensures that when the intensity data from multiple channels is combined, the diffraction peaks are correctly resolved without requiring complex real-time adjustments.
3Loss of time
If a continuous scan is performed with a multi-channel detector to minimize scan time, then loss of time is reduced, but measurement precision deteriorates due to the large angular size of the detector
Solution Approach 1:
The method introduces intensity contribution factors as intermediary elements that mediate between the raw intensity measurements from detection channels with large angular offsets and the final resolved diffraction pattern. These factors act as correction coefficients that account for the geometric effects of the large detector angular size while maintaining the speed benefits of continuous scanning.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the resolution and accuracy of X-ray analysis by evenly spacing intensity datapoints, improving the quality of analysis results, especially for detectors with an angular size of 10 degrees or greater.
Implementation Method 1
X-ray analysis is an analytical technique used to characterize materials... One factor underpinning accurate interpretation of X-ray analysis data obtained from an X-ray analysis procedure is resolution (e.g. the width of diffraction peaks)
Data Source
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AI summary
The invention provides a computer implemented method of X-ray analysis. The method comprises receiving X-ray analysis data from an X-ray detector comprising a plurality of detection channels. The X-ray analysis data comprises intensity angular scan data obtained by measuring X-ray intensity during a continuous scan of the X-ray detector. A sequence of intensity measurements is obtained for each detection channel. Each sequence of intensity measurements forms an intensity angular scan. An angular offset is determined for each detection channel. The method further comprises, for each of a plurality of detection angle bins, determining, for each detection channel, an intensity contribution factor for at least one of the intensity measurements. The intensity contribution factor is determined according to an angular range associated with the detection angle bin and the angular offset of the detection channel. For each of the plurality of detection angle bins, a binned intensity is determined based on the intensity of the at least one intensity measurement and its corresponding intensity contribution factor. The invention relates to pixel splitting when converting two-dimensional X-ray images into one-dimensional diffraction patterns.