X-ray Detector Sensitivity Calibration Using Multipurpose Source
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Solution Overview
Problem
Existing X-ray diffraction analyzers require a uniform and expensive X-ray source for sensitivity correction, making it difficult for users to recalibrate the sensitivity correction coefficient in field settings, and it is challenging to determine if recalibration is necessary.
Innovation Solution
A sensitivity correction coefficient calculating system that uses a multipurpose X-ray source to fit the X-ray intensity distribution with an approximation function, allowing for the calculation of sensitivity correction coefficients for each detection element without the need for a specific X-ray source, enabling recalibration using a reference sample.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a uniform X-ray source is used for sensitivity correction, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent uses an approximation function to create a mathematical model (copy) of the actual X-ray intensity distribution from a multipurpose source. This virtual uniform distribution allows sensitivity correction without requiring a physical uniform X-ray source, resolving the contradiction between measurement precision and device complexity
Solution Approach 2:
The patent changes the approach from using a physical uniform X-ray source to using a mathematical approximation of intensity distribution. By parameterizing the intensity distribution through fitting functions, the system achieves sensitivity correction with a multipurpose source instead of requiring specialized uniform source hardware
2Measurement precision
If a specific uniform X-ray source is required, then sensitivity correction accuracy is improved, but ease of operation deteriorates
Solution Approach 1:
The patent makes the sensitivity correction process universal by enabling it to be performed with a multipurpose X-ray source that can serve both analytical and calibration functions. The approximation function approach allows any X-ray source to be used for sensitivity correction, eliminating the need for specialized uniform sources and making recalibration feasible in field settings
Solution Approach 2:
The system enables users to perform sensitivity correction themselves using the multipurpose X-ray source and approximation function method. This self-service capability eliminates dependence on specialized equipment and external calibration services, significantly improving ease of operation for field recalibration
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the calculation of sensitivity correction coefficients using a multipurpose X-ray source, allowing for recalibration of X-ray detectors without the need for a uniform X-ray source, simplifying the process and making it feasible in field settings.
Implementation Method 1
characteristic X-rays generated in the target can be emitted
Implementation Method 2
detect the diffracted X-rays that are emitted from the powder sample
Implementation Method 3
detection elements for detecting the intensity of the X-rays
Data Source
AI summary
The invention provides a sensitivity correction coefficient calculating system for an X-ray detector with which the sensitivity correction coefficient can be calculated using a multipurpose X-ray source instead of a specific X-ray source. In the sensitivity correction coefficient calculating system for an X-ray detector having a detection surface where detection elements for detection the X-ray intensity are aligned one-dimensionally or two-dimensionally, fitting is carried out on the measured X-ray intensity detected by a detection element using an approximation function so as to calculate the sensitivity correction coefficient using the calculated X-ray intensity calculated from the approximation function and the measured X-ray intensity.