X-ray Detector Substrate Power Control for Energy Reduction
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Solution Overview
Problem
Radiation diagnostic apparatuses, such as X-ray CT systems, waste energy by acquiring output data from radiation detecting elements outside the imaging region, which are unnecessary for image processing, leading to increased power consumption.
Innovation Solution
The apparatus employs processing circuitry to identify and limit the operation of non-observing radiation detecting elements and signal processing substrates, only allowing components within the imaging region to operate, thereby reducing power consumption by stopping or limiting the operation of those outside the imaging region.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If output data from all radiation detecting elements are acquired, then complete imaging coverage is ensured, but power consumption increases due to processing unnecessary data from non-observing regions
Solution Approach 1:
The radiation detector array is divided into multiple independent substrates, each capable of being controlled separately. The control device identifies which substrates correspond to non-observing regions based on imaging conditions and selectively limits their operation, thereby segmenting the processing load to eliminate unnecessary power consumption while maintaining imaging efficiency for observed regions
Solution Approach 2:
Instead of acquiring data from all radiation detecting elements, the system performs partial action by acquiring data only from substrates corresponding to observing regions. This partial acquisition approach eliminates waste of energy on non-observing regions while ensuring complete coverage of the required imaging area
2Reliability
If all radiation detecting elements operate continuously, then no data is lost, but energy is wasted on detecting elements outside the imaging region
Solution Approach 1:
The system dynamically adjusts the operational state of each substrate based on real-time imaging conditions. The control device determines whether each substrate corresponds to an observing or non-observing region and dynamically limits or enables data acquisition accordingly, ensuring data completeness for required regions while reducing energy consumption by deactivating unnecessary substrates
Solution Approach 2:
Each substrate independently processes its own data acquisition and can be independently limited by the control device. This self-service capability allows the system to automatically manage which substrates are active based on imaging requirements, ensuring that only necessary substrates consume energy while maintaining complete data acquisition for observed regions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces power consumption by minimizing the acquisition of unnecessary data from non-observing regions, optimizing energy use during imaging processes.
Implementation Method 1
plural radiation detecting elements 33a configured to detect X-rays radiated from the X-ray tube 31 and passed through the object O
Data Source
AI summary
According to one embodiment, a radiation diagnostic apparatus includes an X-ray tube, radiation detecting elements, signal processing substrates, and processing circuitry. The signal processing substrates performs processing including at least A/D conversion processing on outputted signals of the radiation detecting elements and outputs processed signals as the outputted signals subjected to the processing. The processing circuitry identifies a non-observing element or a non-observing substrate based on information on an imaging region included in imaging conditions of an object, the non-observing element being a radiation detecting element of the radiation detecting elements which corresponds to a region other than the imaging region, and the non-observing substrate being a signal processing substrate of the signal processing substrates which corresponds to the non-observing element. The processing circuitry further controls an operation of the non-observing element or an operation of the non-observing substrate in imaging under the imaging conditions.