X-ray Detector Start Time Detection via TFT Switching
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing X-ray detectors face challenges in accurately detecting the start time of X-ray incidence due to low current values when the thin film transistor is in the off state, especially in medical applications where X-ray intensity is weak, leading to longer processing times and potential image quality issues.
Innovation Solution
The X-ray detector incorporates a substrate with control and data lines, a thin film transistor, a control circuit for switching the transistor's state, and a signal detection circuit to read image data in the on state, allowing for accurate detection of X-ray incidence by judging the start time based on current values when the transistor is on, while also correcting for image spots by reading correction data in the off state.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the current value in the data line is detected when the thin film transistor is in the off state to detect the start time of X-ray incidence, then the start time detection method is provided, but the current value becomes extremely small and accurate detection becomes difficult in medical applications with weak X-ray intensity
Solution Approach 1:
The control circuit switches the thin film transistor to the on state before X-ray irradiation begins, enabling the detection circuit to read image data during the on state. This preliminary action ensures that the transistor is in the optimal state for detection before the actual measurement occurs, allowing accurate start time detection even with weak X-ray signals.
Solution Approach 2:
The invention changes the operational state parameter of the thin film transistor from off state to on state during the detection period. By switching the transistor to the on state, the electrical characteristics change to allow sufficient current flow for accurate detection, thereby resolving the issue of extremely small current values that prevented accurate start time detection.
2Reliability
If the detector waits for an external signal to start operation, then the reading process can be synchronized with X-ray incidence, but a processing time increases due to time lag
Solution Approach 1:
The control circuit performs preliminary switching of the thin film transistor to the on state before X-ray irradiation begins. This preliminary action eliminates the need to wait for external signals during the critical detection phase, thereby reducing processing time while maintaining synchronization reliability through the predetermined timing control.
Solution Approach 2:
The detection circuit continuously monitors image data during the on state period, providing real-time feedback about X-ray incidence. This feedback mechanism allows the system to accurately determine the start time of X-ray incidence without relying on external signals, thereby reducing processing time while maintaining synchronization.
3Loss of energy
If the thin film transistor remains in the off state during X-ray irradiation, then current leakage is minimized, but the ability to detect X-ray incidence start time is compromised due to extremely small current values
Solution Approach 1:
The control circuit periodically switches the thin film transistor between on and off states. During the on state period, the transistor conducts sufficiently to allow accurate start time detection. During the off state period, current leakage is minimized. This periodic switching resolves the contradiction by allowing both detection accuracy and leakage minimization at different times.
Solution Approach 2:
The control circuit switches the thin film transistor to the on state as a preliminary action before X-ray irradiation begins. This preliminary switching ensures that the transistor is in the optimal conduction state for detection, allowing accurate start time detection without excessive current leakage during the actual irradiation period.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables real-time performance and improved X-ray image quality by directly detecting the start time of X-ray incidence, reducing processing time and suppressing image spots, even in low-intensity X-ray conditions.
Implementation Method 1
a control circuit switching an on state and an off state of the thin film transistor
Implementation Method 2
a signal detection circuit reading out an image data in the on state of the thin film transistor
Implementation Method 3
an incident radiation detection part judging a start time of radiation incidence based on a value of the image data read out in the on state of the thin film transistor
Data Source
AI summary
A radiation detector includes a substrate, control lines provided on the substrate and extending in a first direction, data lines provided on the substrate and extending in a second direction crossing the first direction, and detection parts arranged in a matrix. Each detection part includes a thin film transistor and a conversion part converting radiation or light into electricity. Further, a control circuit switches an on state and an off state of each thin film transistor and a signal detection circuit reads out image data in the on state of the thin film transistor. Further, the detector judges a start time of radiation incidence based on a value of the image data read out in the on state of each thin film transistor.


