X-ray Diffraction Analysis Method for Rapid Material Screening
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Solution Overview
Problem
Conventional X-ray diffraction measurement methods require waiting for the completion of data collection before analysis can begin, leading to delays in identifying and quantifying chemical materials, especially in manufacturing processes where deviations from target materials necessitate immediate action.
Innovation Solution
The method involves repetitive analysis of X-ray diffraction measurement data in parallel to the measurement process, allowing for interim analysis results without waiting for completion, using peak positions and integrated intensities to initiate qualitative and quantitative analysis, with precision improving as more data is collected.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional X-ray diffraction measurement methods are used where analysis is performed only after measurement completion, then measurement precision is ensured, but productivity is reduced due to waiting time
Solution Approach 1:
The patent performs preliminary analysis actions during the measurement process itself. Analysis processing is executed on measurement data as it is being collected, rather than waiting for complete data collection. This allows interim analysis results to be obtained without waiting for measurement completion, thereby improving productivity while maintaining measurement precision through the use of all collected data for final analysis.
Solution Approach 2:
The patent maintains continuous useful action by executing analysis processing continuously during the measurement process. The control device repeatedly performs analysis on measurement data as it is collected, ensuring that analysis activity continues throughout the measurement period rather than being idle during data collection and then processing all data at once after completion.
2Productivity
If repetitive analysis is executed in parallel during measurement, then productivity is improved by obtaining interim results, but device complexity increases
Solution Approach 1:
The control device performs multiple functions: it controls the X-ray diffractometer for measurement, executes analysis processing on the measurement data, and manages the repetitive analysis cycles. By consolidating measurement control and analysis processing in a single control device, the patent avoids adding separate dedicated analysis hardware, thereby improving productivity without significantly increasing device complexity.
3Productivity
If analysis is performed on incomplete measurement data, then productivity is improved by early screening, but measurement precision deteriorates
Solution Approach 1:
The patent applies partial action by performing analysis on the portion of measurement data that has been collected so far, rather than waiting for complete data. This allows interim analysis results to be obtained for rapid screening purposes. The system executes analysis repeatedly as data accumulates, providing progressively more accurate results as more measurement data becomes available, thus balancing productivity improvement with acceptable measurement precision for different purposes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid simple screening and progressive enhancement of analysis precision, allowing for early detection of material deviations and accurate identification of chemical materials, reducing equipment load and improving process efficiency.
Implementation Method 1
X-ray diffraction measurement data obtained by an X-ray diffractometer
Implementation Method 2
X-ray diffraction measurement based on the X-ray diffractometer
Data Source
AI summary
Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.