X-ray Diffraction Data Processing Device for Measurement Time Reduction

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Solution Overview

Problem

Conventional X-ray analysis devices require various adjustments before measurement, increasing the overall time required to obtain measurement data.

Innovation Solution

An X-ray diffraction data processing device that processes two-dimensional detection data of diffracted X-rays by extracting peak data, identifying peak positions, and executing data processing using position information, thereby eliminating the need for pre-measurement adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If tilting axis adjustment is performed before measurement to ensure reciprocal lattice points are on the scattering plane, then measurement precision is improved, but measurement time is increased

Engineering Contradiction:

Improveprecision of analysisVSAvoidtime required to acquire measurement data

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary calculation of the scattering plane equation and reciprocal lattice point positions before measurement. By pre-calculating these geometric parameters based on sample information, the system eliminates the need for time-consuming physical tilting axis adjustments while maintaining the precision that would otherwise require such adjustments.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent replaces the mechanical tilting axis adjustment process with a computational approach. Instead of physically adjusting the tilting axis to align reciprocal lattice points with the scattering plane, the system calculates the appropriate scattering plane equation and uses this information to directly process diffraction data, substituting mechanical adjustment with computational geometry.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If various adjustments are made before starting measurement to obtain desired analysis results, then analysis accuracy is improved, but device operation complexity is increased

Engineering Contradiction:

Improveanalysis accuracyVSAvoidease of operation

Core Design Contradiction:

Measurement precisionVSEase of operation

Solution Approach 1:

The patent enables the system to automatically determine the scattering plane equation and reciprocal lattice point positions based on input sample information. The system performs self-calibration by calculating geometric parameters without requiring manual intervention or physical adjustments, making the measurement process simpler while maintaining accuracy.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The patent changes the approach from physical parameter adjustment (tilting axis alignment) to computational parameter calculation (scattering plane equation). By representing the scattering plane as a mathematical equation and calculating reciprocal lattice positions computationally, the system achieves the same analytical accuracy with simpler operation.

Inventive Principle:

Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution significantly reduces the time required to acquire measurement data while maintaining high analysis precision, equivalent to devices that perform tilting axis adjustments.

Implementation Method 1

detecting diffracted X-rays diffracted by a sample using a two-dimensional X-ray detector

Methodology Applied

Scientific EffectX-ray diffraction: Diffraction

Implementation Method 2

two-dimensional detection data of diffracted X-rays

Methodology Applied

Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS20250180495A1X-ray diffraction data processing device and x-ray analysis device

Publication Date: 2025.06.05 RIGAKU CORP

AI summary

A peak two-dimensional detection data extracting unit 211 extracts two-dimensional detection data (peak two-dimensional detection data) of diffracted X-rays Xb presenting maximum X-ray intensity from two-dimensional detection data of the diffracted X-rays Xb obtained at a plurality of scan angles 2θ/θ. Next, a peak position identifying unit 212 identifies, from the peak two-dimensional detection data, a position at which the X-ray intensity is maximum (peak position). Then, data processing is performed using position information of the peak position identified for the peak two-dimensional detection data.