X-Ray Diffraction Measurement at Flange Fillets with 3D Positioning
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Solution Overview
Problem
The measurement of residual stress in metal structures with a cylindrical axis and radially protruding flange using X-rays is hindered by interference between the X-ray stress measuring apparatus and the flange or axis, making it difficult to arrange the apparatus in a desired position.
Innovation Solution
A measurement system with a diffracted X-rays measurement device equipped with an irradiation unit and a positioning device that includes a moving mechanism for three-dimensional movement and a rotation mechanism to adjust the angle of incidence, controlled by a unit that prevents contact with the axis and flange, allowing for easy measurement of the intensity distribution of diffracted X-rays.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the X-ray stress measuring apparatus is positioned close to the fillet portion for accurate measurement, then measurement precision is improved, but the apparatus interferes with the flange portion or axis portion making arrangement difficult
Solution Approach 1:
The apparatus transitions from a static fixed-position design to a dynamic adjustable-position design. The positioning device includes a moving mechanism with multiple degrees of freedom that allows the X-ray emitter and imaging plate to be dynamically repositioned around the fillet portion, enabling accurate measurement while avoiding interference with flange or axis portions
Solution Approach 2:
The apparatus adds spatial dimensionality to the measurement system by incorporating three-dimensional positioning capabilities. The positioning device allows movement in multiple directions and rotation around the measurement target, transforming the apparatus from a single-position tool to a multi-position system that can access the fillet portion from optimal angles without interfering with surrounding structures
2Ease of operation
If the apparatus is arranged to avoid interference with flange or axis portions, then ease of operation is improved, but measurement precision deteriorates due to suboptimal positioning
Solution Approach 1:
The system uses dynamic positioning to achieve both ease of operation and measurement precision. The positioning device allows operators to easily arrange the apparatus in non-interfering positions while maintaining measurement accuracy through adjustable positioning that optimizes the X-ray incidence angle and detection geometry for each specific measurement location
Solution Approach 2:
The apparatus changes geometric parameters (position coordinates, orientation angles, incidence angles) to simultaneously achieve non-interfering arrangement and optimal measurement conditions. The positioning device enables continuous adjustment of these parameters to find the optimal configuration for each measurement scenario
3Ease of manufacture
If the apparatus structure is simplified for ease of manufacture, then manufacturing cost is reduced, but positioning accuracy deteriorates
Solution Approach 1:
The positioning device is segmented into functional modules (moving mechanism, rotation mechanism, positioning control system) that can be manufactured and assembled separately. This modular approach maintains positioning accuracy while improving ease of manufacture through standardized components and simplified assembly procedures
Solution Approach 2:
The patent introduces a positioning device as an intermediary system between the simple apparatus structure and the requirement for high positioning accuracy. This intermediary layer provides the necessary precision through its mechanical design and control systems while allowing the main apparatus to remain relatively simple and easy to manufacture
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and reliable measurement of the intensity distribution of diffracted X-rays in a desired arrangement, facilitating accurate calculation of residual stress and half width of the X-ray diffraction intensity curve.
Implementation Method 1
an irradiation unit that irradiates the fillet portion with X-rays
Implementation Method 2
intensities of diffracted X-rays generated by reflection of the X-rays by the specimen
Data Source
AI summary
A measurement system according to an aspect of the present invention enables measurement of an intensity distribution of diffracted X-rays obtained by irradiating a fillet portion of a metallic structure with X-rays, the metallic structure comprising: an axis portion; and a flange portion protruding radially from the axis portion, wherein the metallic structure comprises the fillet portion in a connection portion between the axis portion and the flange portion, the measurement system including: a diffracted X-rays measurement device provided with an irradiation unit that irradiates the fillet portion with X-rays; and a positioning device that positions the diffracted X-rays measurement device with respect to the fillet portion, in which the positioning device including: a moving mechanism that moves three-dimensionally the diffracted X-rays measurement device relative to the fillet portion; and a rotation mechanism that rotates the diffracted X-rays measurement device in such a direction that an angle of incidence of the X-rays with respect to the fillet portion is changed.