X-ray Diffraction Measurement Apparatus with Inclined Slits
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Solution Overview
Problem
Existing X-ray diffraction measurement methods struggle to simultaneously obtain accurate measurement results for multiple materials with different diffraction angles, requiring repeated adjustments of the field-of-view limiting slit and resulting in incomplete or incorrect data, especially during in-situ observations of lithium ion battery charging and discharging processes.
Innovation Solution
An X-ray diffraction measurement apparatus equipped with multiple passage limiting members having linear slits and two-dimensional detectors, where each passage limiting member is inclined to allow X-rays to pass through at specific angles, enabling simultaneous detection and calculation of diffraction profiles for multiple materials using a single X-ray detection operation, with adjustable positions and postures controlled by a servo mechanism.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single field-of-view limiting slit is used for X-ray diffraction measurement, then the measurement setup is simple, but it is impossible to simultaneously obtain accurate measurement results for multiple materials with different diffraction angles
Solution Approach 1:
The patent divides the single field-of-view limiting slit into multiple passage limiting members (first, second, and third passage limiting members), each with its own linear slit oriented at different angles. This segmentation allows each passage limiting member to capture diffraction patterns from materials with different diffraction angles simultaneously, resolving the contradiction between simple setup and accurate multi-material measurement.
2Adaptability or versatility
If the field-of-view limiting slit position is adjusted to observe different materials, then different materials can be observed, but the measurement requires repeated adjustments and cannot obtain correct measurement results for all materials in a single operation
Solution Approach 1:
The patent introduces angular orientation as an additional dimension by inclining the linear slits of different passage limiting members at different angles relative to the incident X-ray beam. This allows the system to simultaneously capture diffraction patterns from multiple materials with different diffraction angles in a single measurement operation, eliminating the need for repeated adjustments and significantly improving measurement efficiency.
3Measurement precision
If passage limiting members with inclined slits are used to capture multiple diffraction angles, then simultaneous measurement of multiple materials is enabled, but the device complexity increases
Solution Approach 1:
The patent designs each passage limiting member with a linear slit that can be inclined at specific angles, creating a universal configuration that can capture diffraction patterns from multiple materials simultaneously. The inclined slits serve multiple functions: they define the field of view for each passage limiting member, select specific diffraction angles, and enable simultaneous multi-material measurement, thereby managing complexity through functional integration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate and reliable simultaneous measurement of properties for multiple materials with different diffraction angles, improving measurement efficiency and accuracy by utilizing the full detection region of two-dimensional detectors and maintaining high spatial resolution and signal intensity.
Implementation Method 1
an X-ray generator (12) configured to radiate X-rays toward the object to be measured
Implementation Method 2
measure properties of an object to be measured based on X-ray diffraction generated by the object to be measured at an intersection position
Implementation Method 3
passage limiting members having linear slits through which X-rays are allowed to pass after the X-ray diffraction; each of the plurality of passage limiting members is disposed in a manner such that the slit is inclined at least in an axial direction
Implementation Method 4
two-dimensional detectors configured to detect the X-rays, which have passed through the slits, within a detection region
Data Source
AI summary
The present invention provides an X-ray diffraction measurement apparatus configured to measure properties of an object to be measured M based on X-ray diffraction generated by the object to be measured at an intersection position between an incident optical axis and outgoing optical axes, the X-ray diffraction measurement apparatus including: three slits of a linear shape through which X-rays pass and that are arranged so as to be inclined in an axial direction of the outgoing optical axis; a first two-dimensional detector and a second two-dimensional detector that detect the X-rays passing through the slits within a detection region; and a profile calculator that calculates diffraction profiles indicating intensities of the passing X-rays detected by the two-dimensional detectors, for each of the passing X-rays, thereby being capable of simultaneously obtaining measurement results relating to properties of a plurality of materials having different diffraction angles.