X-ray Diffraction Spectroscopy Spatial Resolution

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Solution Overview

Problem

Existing X-ray diffraction spectroscopy methods lack precise spatial information on the composition of objects, failing to accurately segment objects into elementary volumes and identify materials within these volumes.

Innovation Solution

A method involving a collimated beam of ionizing electromagnetic radiation, a detector with multiple pixels, and a second collimator to enhance angular resolution, allowing for the decomposition of objects into elementary volumes and the determination of scattering signatures associated with each volume, using reference materials and dispersion functions to estimate material composition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a relatively large aperture second collimator is used with virtual pixel subdivision, then angular resolution is improved and spectral resolution is enhanced, but precise spatial information on object composition is lost

Engineering Contradiction:
Improvespectral resolutionVSAvoidspatial information
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The detector is divided into multiple pixels, and each pixel is further subdivided into virtual pixels. This segmentation allows the system to capture spatially resolved scattering spectra, where each virtual pixel corresponds to a specific angular range and spatial position, thereby recovering spatial information that would otherwise be lost with a large aperture collimator.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention introduces a spatial dimension to the spectral measurement by associating each virtual pixel with specific spatial coordinates and angular ranges. This transforms the measurement from a single integrated spectrum into a set of spatially-resolved spectra, enabling reconstruction of material composition as a function of position within the object.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If conventional X-ray diffraction spectroscopy is used, then material identification is possible, but spatial resolution and segmentation into elementary volumes is insufficient

Engineering Contradiction:
Improvematerial identificationVSAvoidspatial resolution
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The invention applies local quality by determining scattering signatures for each elementary volume separately. Each pixel (and its virtual pixels) measures scattering from specific spatial regions, allowing material identification to be performed locally for each volume element rather than for the entire object as a whole. This enables precise spatial mapping of material composition.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention introduces dispersion functions as an intermediary between the measured scattering spectra and the material composition of elementary volumes. These dispersion functions mathematically relate the scattering signal from each pixel to the contribution from each elementary volume, enabling the reconstruction of spatially-resolved material signatures through computational processing.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Speed

If a finely collimated beam is used with a first collimator, then beam directionality is improved, but the system complexity and device structure increase

Engineering Contradiction:
Improvebeam directionalityVSAvoidcollimator structure
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The invention uses partial collimation with a first collimator to provide sufficient beam directionality without requiring complete or excessive collimation. The collimator aperture is optimized to achieve the necessary spatial resolution while minimizing device complexity and maintaining practical system design.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach provides improved spatial resolution and precise material identification within elementary volumes, enabling more accurate analysis of composite objects and enhancing non-destructive testing and medical diagnostics.

Implementation Method 1

a source of irradiation emitting ionising electromagnetic radiation and irradiating the object using said source, through a first collimator, so as to form a collimated incident beam propagating towards the object along a propagation axis

Methodology Applied
Scientific EffectElectromagnetic radiation: Electromagnetic Induction

Implementation Method 2

This technique is based on elastic scattering of ionising electromagnetic radiation, which is also called Rayleigh scattering

Methodology Applied
Scientific EffectRayleigh scattering: Rayleigh Scattering

Implementation Method 3

determining the energy spectrum of the radiation backscattered by the object at small angles, typically comprised between 1° and 20°, to the path of the x-ray radiation incident on the object

Methodology Applied
Scientific EffectX-ray scattering: Scattering

Implementation Method 4

A second collimator is then placed between the analysed object and a detector, the latter being able to acquire an energy spectrum of the radiation backscattered by the object

Methodology Applied
Scientific EffectCollimation:

Implementation Method 5

a detector comprising a plurality of pixels, so that each pixel is able to detect radiation scattered by the object thus irradiated

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 6

X-ray diffraction spectroscopy, better known by the acronym EDXRD (energy dispersive x-ray diffraction) is a non-destructive analysis technique used to identify the materials making up an object

Methodology Applied
Scientific EffectX-ray diffraction: Diffraction

Data Source

PatentUS10371651B2Method for analyzing an object by X-ray diffraction
Publication Date: 2019.08.06 COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
  • US10371651B2 patent drawing
  • US10371651B2 patent drawing
  • US10371651B2 patent drawing

AI summary

The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.