X-ray Diffraction Stress Detection in Transparent Materials

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Existing methods are unable to effectively apply X-ray diffraction for detecting internal stress distribution in transparent materials like diamond and quartz, due to the limitations of X-ray diffraction in handling light elements.

Innovation Solution

A method involving the establishment of coordinates for stress detection positions, preprocessing of the transparent material and a standard reference material, calculating placement coordinates, synthesizing a standard reference material-containing transparent material, and using X-ray diffraction to detect pressure loads within this composite material, thereby determining internal stress.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If X-ray diffraction is used to detect internal stress in transparent materials, then measurement accuracy is improved, but the method cannot be applied to transparent materials containing light elements

Engineering Contradiction:

Improveinternal stress measurement accuracyVSAvoidapplicability to transparent materials

Core Design Contradiction:

Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent introduces a standard reference material as an intermediary substance embedded within the transparent material. This reference material serves as a mediator that interacts with X-rays to produce detectable diffraction patterns, enabling indirect measurement of internal stress in transparent materials that would otherwise be invisible to X-ray diffraction detection

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the detection parameter from direct observation of transparent material diffraction to measurement of standard reference material diffraction patterns. By monitoring the shift in diffraction peak positions of the reference material under different stress conditions, the internal stress state of the transparent material is inferred through parameter correlation

Inventive Principle:

Principle #35Parameter changes

2Difficulty of detecting and measuring

If a standard reference material is embedded in the transparent material for X-ray diffraction detection, then detection capability is improved, but the operation complexity increases

Engineering Contradiction:

Improvedetection capabilityVSAvoidmeasurement operation convenience

Core Design Contradiction:

Difficulty of detecting and measuringVSEase of operation

Solution Approach 1:

The patent performs preliminary actions by pre-establishing the relationship between standard reference material diffraction patterns and internal stress levels before actual measurement. The coordinate system is pre-defined, and the reference material's stress-response characteristics are pre-characterized, allowing direct measurement during operation without complex real-time analysis

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent uses the standard reference material as a copy or proxy for the transparent material's stress state. The reference material replicates the stress conditions experienced by the transparent material, providing a measurable copy of the stress information that can be detected through X-ray diffraction

Inventive Principle:

Principle #26Copying

3Measurement precision

If coordinates are established for multiple stress detection positions, then measurement precision is improved, but the time consumption increases

Engineering Contradiction:

Improvedetection position accuracyVSAvoidmeasurement time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the measurement process into discrete detection positions with established coordinates. Each position is assigned specific coordinate values, allowing systematic measurement across multiple locations. The segmentation enables organized data collection while maintaining efficiency through structured positioning

Inventive Principle:

Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method significantly improves the accuracy of internal stress measurement in transparent materials, enabling non-destructive detection of stress distribution with high precision and convenience, applicable to transparent materials of any size.

Implementation Method 1

detecting a pressure of the standard reference material in the standard reference material-containing transparent material using X-ray diffraction

Methodology Applied

Scientific EffectX-ray diffraction: Bragg Diffraction

Data Source

PatentUS12203881B2Method of detecting internal stress distribution of transparent material based on x-ray diffraction

Publication Date: 2025.01.21 ZHEJIANG UNIV

AI summary

A method of detecting internal stress distribution of a transparent material based on X-ray diffraction, which includes the following steps. Coordinates of stress detection positions of a transparent material are established. An initial powder of the transparent material and a standard reference material are processed. A placement coordinate position of the standard reference material on the transparent material is calculated. A standard reference material-containing transparent material is synthesized. Internal stress of the standard reference material is detected as the internal stress of the transparent material at the placement coordinate position.