X-ray Dosage Mitigation for Semiconductor Inspection

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Solution Overview

Problem

Current X-ray inspection systems cannot measure total X-ray dosage in real time, leading to potential latent damage to electronic components such as semiconductors during inspection.

Innovation Solution

A system and method that employs a radiation generator to expose electronic components to ionizing radiation within a contained environment, using radiation detectors to measure and map the total radiation dosage, triggering an alarm when a pre-determined limit is reached, and adjusting exposure settings to prevent damage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If X-ray inspection is performed on electronic components, then defect detection capability is improved, but latent damage to components occurs due to cumulative radiation dosage

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidlatent damage to components
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The system continuously monitors cumulative radiation dosage in real-time and provides feedback to control the inspection process. When the accumulated dose approaches a predetermined threshold, the system automatically adjusts inspection parameters or terminates exposure, preventing latent damage while maintaining defect detection capability

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system pre-determines safe radiation dosage thresholds based on component sensitivity and inspection requirements. By establishing these limits before inspection begins, the system can proactively control exposure levels to prevent latent damage while ensuring adequate defect detection

Inventive Principle:
Principle #10Preliminary action

2Reliability

If real-time radiation dosage measurement is implemented, then component safety is improved, but system complexity increases

Engineering Contradiction:
Improvecomponent safetyVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The radiation detection system serves multiple functions: it measures real-time dosage, tracks cumulative exposure, compares against thresholds, and triggers control actions. This multi-functionality reduces the need for separate safety systems while improving component protection

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system automatically monitors and controls its own radiation exposure parameters without external intervention. The self-monitoring and self-regulation capabilities reduce the need for additional safety personnel or external monitoring equipment

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system effectively reduces or eliminates latent damage by measuring and controlling X-ray dosage, ensuring safe inspection conditions for electronic components.

Implementation Method 1

employing a radiation generator to expose the electronic component to an ionizing radiation

Methodology Applied
Scientific EffectX-ray generation: X-Ray

Implementation Method 2

measuring a total radiation dosage received by the electronic component

Methodology Applied
Scientific EffectRadiation detection: Absorption (EM radiation)

Data Source

PatentUS11226297B2X-ray dosage mitigation for semiconductors and material inspection systems
Publication Date: 2022.01.18 RAYTHEON CO
  • US11226297B2 patent drawing
  • US11226297B2 patent drawing
  • US11226297B2 patent drawing

AI summary

A method for determining a total radiation dosage received by an electronic component includes employing a radiation generator to expose the electronic component to an ionizing radiation within a contained environment of an inspection system. The method further includes measuring a total radiation dosage received by the electronic component based on a pre-determined position in the contained environment of the inspection system.