X-ray Energy Spectrum Determination via Beam Deflection
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Solution Overview
Problem
Current radiation therapy systems face challenges in accurately determining the energy spectrum of electron beams, which is crucial for delivering precise radiation doses, as existing methods require inserting measurement devices into the accelerating tube system.
Innovation Solution
A method and system that utilize a beam deflection device to adjust deflection currents, determining energy ranges and target currents of ejected electron beams, allowing for the calculation of the energy spectrum of incident electron beams without the need for additional measurement devices in the accelerating tube system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If measurement devices are inserted into the accelerating tube system to determine electron beam energy spectrum, then measurement accuracy is improved, but device complexity and system intrusion increase
Solution Approach 1:
The patent introduces a beam deflection device as an intermediary component that deflects electron beams based on their energy levels. This mediator separates electrons into different energy ranges without requiring direct insertion of measurement devices into the accelerating tube, thus maintaining measurement accuracy while reducing system intrusion and complexity
Solution Approach 2:
The patent replaces direct physical measurement devices with a magnetic field-based deflection system. By using electromagnetic fields to deflect electron beams and measure deflection angles, the system avoids mechanical insertion of probes into the accelerating tube, reducing complexity while maintaining measurement precision
2Device complexity
If beam deflection device is used to determine energy spectrum by adjusting deflection currents, then device complexity is reduced, but measurement precision may be compromised
Solution Approach 1:
The patent employs dynamic adjustment of deflection currents in the beam deflection device to optimize electron beam separation. By dynamically varying the magnetic field strength through controlled current adjustment, the system achieves precise energy range separation and accurate spectrum determination while maintaining system simplicity
Solution Approach 2:
The patent changes the deflection angle parameter by adjusting deflection currents to correspond with different electron energy ranges. This parameter variation allows the system to accurately map electron energies to specific deflection angles, maintaining measurement precision while using a simpler non-intrusive measurement approach
3Measurement precision
If multiple deflection currents are used to cover different energy ranges, then energy spectrum coverage is improved, but measurement time increases
Solution Approach 1:
The patent uses periodic adjustment of deflection currents to systematically scan through different electron energy ranges. By implementing a structured sequence of current adjustments that correspond to different energy bins, the system achieves complete energy spectrum coverage while minimizing measurement time through efficient sequential sampling
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate determination of electron beam energy spectra without inserting devices into the accelerating tube, improving radiation dose precision and eliminating the need for complex measurement setups.
Implementation Method 1
determining a magnetic field strength generated by the beam deflection device based on the deflection current
Implementation Method 2
determining an energy range of an ejected electron beam... determining a center energy value of the energy range of the ejected electron beam based on the magnetic field strength and a deflection radius
Data Source
AI summary
The present disclosure discloses a method and a system for determining an energy spectrum of an incident electron beam. The method includes obtaining a plurality of deflection currents of a beam deflection device; for each of the plurality of deflection currents, determining an energy range of an ejected electron beam, and determining a target current of a target generated by the ejected electron beam irradiating the target, wherein the ejected electron beam is emitted from an output of the beam deflection device after the incident electron beam enters the beam deflection device. The method also includes determining the energy spectrum of the incident electron beam based on the energy ranges of the plurality of ejected electron beams and the corresponding target currents.


