X-Ray Fillet Stress Measurement Around Axis-Flange Interference
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Solution Overview
Problem
The measurement of residual stress in metal structures with cylindrical axes and flange portions using X-ray diffraction is hindered by interference between the X-ray stress measuring apparatus and the flange or axis, making it difficult to arrange the apparatus in a desired position.
Innovation Solution
A measurement system and method that utilize a control unit to control a moving mechanism and rotation mechanism, ensuring the diffracted X-rays measurement device avoids contact with the axis and flange portions by adhering to specific inequalities, allowing for easy and reliable measurement of intensity distribution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the X-ray stress measuring apparatus is arranged to measure residual stress in the fillet portion, then the measurement accuracy is improved, but the apparatus may come into contact with the axis portion or flange portion, making arrangement difficult
Solution Approach 1:
The patent employs a moving mechanism that enables the diffracted X-rays measurement device to dynamically adjust its position and orientation. This dynamic positioning system allows the apparatus to reach measurement positions on the fillet portion without colliding with the axis or flange portions, thus maintaining measurement accuracy while improving arrangement ease.
Solution Approach 2:
The patent introduces a control unit as an intermediary that coordinates between the measurement requirements and the physical constraints of the metal structure. The control unit calculates appropriate positioning based on the shape data of the axis and flange portions, mediating between the need for precise measurement and the need to avoid collisions.
2Ease of operation
If the diffracted X-rays measurement device is positioned to avoid contact with axis and flange portions, then the ease of operation is improved, but the measurement precision may be compromised
Solution Approach 1:
The patent performs preliminary actions by pre-acquiring shape data of the axis and flange portions before measurement. The control unit uses this pre-acquired data to calculate safe measurement positions and trajectories, ensuring that the measurement device can operate without collision while maintaining measurement precision through pre-planned positioning.
Solution Approach 2:
The patent implements feedback mechanisms where the control unit continuously monitors the position of the measurement device and adjusts it based on the calculated safe zones. The system uses feedback from the shape data and positioning information to ensure the device remains in optimal measurement positions without contacting the axis or flange portions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and accurate measurement of diffracted X-rays intensity distribution and calculation of residual stress and half width in a desired arrangement, reducing measurement errors and facilitating comprehensive understanding of stress distribution.
Implementation Method 1
a lattice distortion occurring inside a specimen having a crystalline structure is measured using X-rays
Implementation Method 2
two-dimensionally detecting intensities of diffracted X-rays generated by reflection of the X-rays by the specimen
Data Source
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AI summary
A measurement system according to an aspect of the present invention enables measurement of an intensity distribution of diffracted X-rays obtained by irradiating a fillet portion of a metallic structure with X-rays, the metallic structure comprising: an axis portion; and a flange portion protruding radially from the axis portion, wherein the metallic structure comprises the fillet portion in a connection portion between the axis portion and the flange portion, the measurement system including: a diffracted X-rays measurement device provided with an irradiation unit that irradiates the fillet portion with X-rays; and a positioning device that positions the diffracted X-rays measurement device with respect to the fillet portion, in which the positioning device including: a moving mechanism that moves three-dimensionally the diffracted X-rays measurement device relative to the fillet portion; and a rotation mechanism that rotates the diffracted X-rays measurement device in such a direction that an angle of incidence of the X-rays with respect to the fillet portion is changed.