X-ray fluorescence imaging for layer thickness
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Solution Overview
Problem
Current non-destructive examination methods for layered structures, such as polychromy in medieval paintings, face challenges in achieving high resolution with thick substrates, as existing techniques require thin X-ray beams and complex apparatus, leading to time-consuming and costly measurements.
Innovation Solution
A method using a plane beam of penetrating radiation with a sharp edge, incident at an acute angle, detected by an imaging camera to analyze fluorescent and scattered photons, allowing for high-resolution measurement of layer thickness without the need for thin beams, simplifying apparatus design and reducing measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a thin plane X-ray beam is used to achieve micrometre resolution, then measurement precision is improved, but measurement time increases excessively and beam intensity drops dramatically
Solution Approach 1:
The patent transitions from conventional transmission tomography (beam perpendicular to surface) to grazing incidence geometry (beam at acute angle to surface). This dimensional change in beam orientation allows the use of thicker beams while maintaining micrometre resolution through the sharp edge effect, thereby reducing measurement time without sacrificing precision.
Solution Approach 2:
The patent changes the incidence angle parameter to acute angles (grazing incidence) rather than perpendicular incidence. This parameter change enables the use of thicker X-ray beams that maintain sufficient intensity while achieving high resolution through the sharp edge of the beam at the acute angle, resolving the contradiction between beam thickness and resolution.
2Measurement precision
If a thin plane X-ray beam is used to achieve micrometre resolution, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
By changing the beam incidence geometry to grazing angles, the patent eliminates the need for complex capillary optical systems or multiple detectors. The sharp edge of the beam at acute incidence naturally provides the resolution enhancement, simplifying the apparatus while maintaining micrometre precision.
3Loss of information
If three detectors are used for transmission and fluorescent radiation detection, then measurement completeness is improved, but device complexity and vulnerability to damage increase
Solution Approach 1:
The patent combines transmission measurement and fluorescent radiation detection into a single detector setup using grazing incidence geometry. The acute angle beam geometry allows one detector to capture both transmission information and fluorescent emission, merging the functions of multiple detectors into a single simplified system that maintains measurement completeness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables high-resolution, non-destructive examination of layered structures with a thick substrate, reducing measurement time and apparatus complexity while maintaining high resolution, suitable for analyzing larger areas efficiently.
Implementation Method 1
fluorescent radiation emanating from the irradiated material of the examined area
Implementation Method 2
scattered particles coming out of the irradiated place of interest
Data Source
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AI summary
The invention discloses a method of the non-destructive examination of a layered structure, within the framework of which the examined object (5) is irradiated in the place of interest by a plane beam (4) of penetrating radiation with a sharp edge at an angle (α) of incidence in the order of units of degrees, subsequently the imaging camera (3) detects fluorescent radiation and scattered particles, based on the recorded signal of which passages (δ) with an increasing/decreasing change of values of the signal are ascertained and the thickness of the layer is subsequently determined using the formula tn = δn • tg α.