X-ray tube focal point correction via thermal offset

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Solution Overview

Problem

The position of the focal point in X-ray tubes used in CT devices shifts due to thermal expansion and contraction, leading to artifacts in reconstructed images, as existing methods lack accurate systems and methods for determining and correcting this offset.

Innovation Solution

A method and system that utilize a computing device to obtain parameters such as thermal capacity and scanning duration of the X-ray tube, determine a target offset based on reference relationships, and adjust the electric or magnetic field to correct the focal point position, thereby ensuring accurate image reconstruction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Duration of action of stationary object

If thermal expansion and contraction of the anode target plate is allowed to occur naturally, then the X-ray tube can operate continuously, but the focal point position shifts causing artifacts in reconstructed images

Engineering Contradiction:
Improvecontinuous operation of X-ray tubeVSAvoidfocal point position accuracy
Core Design Contradiction:
Duration of action of stationary objectVSManufacturing precision

Solution Approach 1:

The patent changes the parameter of focal point position by dynamically adjusting the electron beam emission position based on thermal capacity and scanning duration. The computing device calculates the offset of the focal point from the reference position and adjusts the electron beam parameters to compensate for thermal expansion, thereby maintaining imaging precision during continuous operation

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces mechanical adjustment mechanisms with a computing-based system that calculates and corrects focal point position through software algorithms. The computing device processes thermal capacity and scanning duration data to determine offset corrections, substituting physical mechanical adjustment with computational methods

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Manufacturing precision

If the focal point position is corrected by adjusting electron beam emission, then imaging precision is improved, but the system complexity increases due to additional computing and control mechanisms

Engineering Contradiction:
Improvefocal point position accuracyVSAvoidcorrection system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The computing device performs multiple functions: it monitors thermal capacity, tracks scanning duration, calculates focal point offset, and controls electron beam adjustment. By consolidating these functions into a single multi-functional computing system, the patent reduces overall device complexity while maintaining correction capabilities

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system automatically monitors its own operational parameters (thermal capacity, scanning duration) and self-corrects the focal point position without external intervention. The computing device uses built-in sensors and algorithms to detect offset and adjust electron beam emission autonomously, eliminating the need for separate manual calibration systems

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively corrects the focal point position in real-time during scanning, reducing artifacts in CT images and improving diagnostic accuracy by dynamically adjusting the electron beam emission to maintain focus.

Implementation Method 1

Since the temperature of each part of the anode target plate changes due to thermal expansion and contraction, the position of the focal point of the X-rays may be shifted

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Implementation Method 2

electrons emitted from the filament are accelerated and reach the focal position on the anode target disc

Methodology Applied
Scientific EffectThermionic emission: Thermionic Emission

Data Source

PatentUS11610753B2Systems and methods for correction of position of focal point
Publication Date: 2023.03.21 SHANGHAI UNITED IMAGING HEALTHCARE
  • US11610753B2 patent drawing
  • US11610753B2 patent drawing
  • US11610753B2 patent drawing

AI summary

Systems and methods for determining an offset of a position of a focal point of an X-ray tube is provided. The methods may include obtaining at least one parameter associated with an X-ray tube during a scan of a subject. The methods may further include determining a target offset of a position of a focal point based on the at least one parameter and a target relationship between a plurality of reference parameters associated with the X-ray tube and a plurality of reference offsets of reference positions of the focal point. The methods may further include causing, based on the target offset, a correction on the position of the focal point of the X-ray tube.