X-Ray Focal Position Control for Variable-Size Subject Imaging
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Solution Overview
Problem
Conventional X-ray imaging systems face challenges in capturing clear images of both small and large objects, as the focal positions of electron beams remain fixed, leading to blurring or incomplete imaging due to positional deviations in reconstructed images.
Innovation Solution
The X-ray imaging apparatus adjusts the distance between focal positions of electron beams based on the size of the subject by controlling electron emitters, allowing for variable spacing to ensure clear imaging of both small and large objects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the focal positions of multiple electron beams are kept at a constant distance, then the system structure is simple and stable, but the imaging quality deteriorates for objects of different sizes due to overlapping detection ranges and positional deviations
Solution Approach 1:
The patent implements dynamic adjustment of focal positions by controlling different electron emitters to emit electron beams with varying focal distances based on object size. The controller dynamically selects which electron emitters to activate and adjusts their respective focal positions, transforming a static system into a dynamic one that adapts to different imaging requirements, thereby resolving the contradiction between imaging precision and system complexity
Solution Approach 2:
The patent changes the parameter of focal position distance according to object size. For small objects, multiple electron beams are focused at the same position or closely spaced positions; for large objects, the focal positions are separated by larger distances. This parameter adjustment optimizes imaging precision for different object sizes while managing system complexity through controlled variability
2Productivity
If multiple electron beams are emitted simultaneously, then the imaging speed is improved, but the detection accuracy deteriorates due to overlapping X-ray detection ranges causing blurring in reconstructed images
Solution Approach 1:
The patent applies local quality by assigning different focal positions to different electron beams based on the object's size and shape. Each electron beam is focused at an optimized position that prevents overlapping detection ranges, ensuring high detection accuracy while maintaining the benefit of multiple simultaneous beams for improved imaging speed
Solution Approach 2:
The patent segments the imaging task by dividing the object into multiple regions, each imaged by a separate electron beam focused at an appropriate position. This segmentation allows simultaneous imaging of different regions without overlap, maintaining both high imaging speed and detection accuracy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures accurate and clear imaging of subjects by minimizing positional deviations and blurring, regardless of size, through controlled electron beam focal position adjustments.
Implementation Method 1
a plurality of electron emitters 13 each having a plurality of electron sources 131 for emitting electron beams 9b
Implementation Method 2
the target 15b having an inclined surface 151b inclined to emit X-rays 9a generated by each of the plurality of electron beams 9b focused
Data Source
AI summary
This X-ray imaging apparatus is equipped with an X-ray tube, a detector for detecting X-rays emitted from the X-ray tube and transmitted through the subject, and an image processing unit for generating an image based on a detection signal output from the detector. The X-ray imaging apparatus is provided with a controller configured to cause X-rays to be emitted such that the distance between the plurality of focal positions of the plurality of electron beams on the inclined surface differs as viewed from the subject's side, depending on the size of the subject, by causing a part of the plurality of electron emitters to emit electron beams.