Parallel-Slit X-Ray Goniometer for Minute-Region Measurement
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Solution Overview
Problem
Existing X-ray analysis apparatuses face challenges in downsizing while maintaining the capability to measure minute portions due to limitations in optical system components, particularly when the goniometer arms are long and restrict the arrangement of X-ray generators and incident optical systems.
Innovation Solution
An X-ray analysis apparatus with a goniometer featuring an incident-side arm, a support base, a parallel slit formed by two parallel plates, and a receiving-side arm with a detector, allowing for a simple configuration and small size, capable of measuring minute portions using a parallel slit to limit the X-ray beam width and a moving mechanism to adjust the slit position.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the goniometer has long arms to arrange various optical system components, then the X-ray analysis apparatus can perform comprehensive measurements, but the apparatus size increases and becomes unsuitable for general purpose use
Solution Approach 1:
The patent combines the X-ray source and parallel slit into a single integrated unit mounted on the incident-side arm of the goniometer. This merging of components allows the apparatus to maintain comprehensive measurement capability while reducing overall apparatus size, making it suitable for general purpose use.
Solution Approach 2:
The patent designs a compact goniometer system that can perform multiple types of X-ray measurements (diffraction, scattering, etc.) using a unified configuration. The incident-side arm accommodates both the X-ray source and parallel slit, enabling the apparatus to function as a universal measurement tool without requiring separate specialized equipment.
2Measurement precision
If a parallel slit is used to limit the line width of the X-ray beam for measuring minute portions, then the measurement precision improves, but the X-ray beam intensity varies and the configuration becomes complex
Solution Approach 1:
The patent employs a parallel slit with a specific geometric configuration where the slit width varies along its length according to a predetermined relationship. This local variation in slit width compensates for the natural divergence of the X-ray beam, maintaining uniform beam intensity across the irradiated area while preserving the capability to measure minute portions with high precision.
3Device complexity
If the parallel slit is fixed in position, then the configuration is simple, but the apparatus cannot adapt to different measurement requirements
Solution Approach 1:
The patent incorporates a moving mechanism that enables the parallel slit to be positioned at multiple predetermined locations along the incident-side arm of the goniometer. This dynamic positioning capability allows the apparatus to adapt to different measurement requirements (such as varying beam widths or irradiation areas) while maintaining a relatively simple overall configuration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables measurement of minute portions with reduced variations in X-ray beam intensity and uniform irradiation area, suitable for pole and stress measurements, while utilizing existing components and achieving a compact design.
Implementation Method 1
an X-ray source, which is arranged on the incident-side arm and is configured to generate an X-ray beam extending in a second direction
Implementation Method 2
a parallel slit formed by two parallel plates arranged on the fixing portion, and configured to limit a line width along the second direction of the X-ray beam
Implementation Method 3
a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample
Data Source
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AI summary
Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.