Non-Destructive Grain Orientation Testing via X-Ray Diffraction
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Solution Overview
Problem
Current methods for determining the grain orientation of single crystal (SX) and directionally solidified (DS) materials are destructive, as they require mechanical sectioning or removal of an overlying polycrystalline layer, which can alter the material's strength characteristics and make it unsuitable for use.
Innovation Solution
A non-destructive x-ray diffraction system that applies differential loading to an article with an overlying polycrystalline layer, analyzing the stress response of the layer to indirectly determine the underlying crystalline material's orientation, using a controller to calculate slopes from measured stress and load conditions and correlate them with known orientations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If mechanical sectioning or removal of overlying polycrystalline layer is used to determine grain orientation, then grain orientation can be determined, but the material's strength characteristics are altered and it becomes unsuitable for use
Solution Approach 1:
The patent replaces mechanical sectioning or removal methods with x-ray diffraction technology to determine grain orientation. The x-ray diffraction system measures the diffraction pattern of x-rays interacting with the crystalline structure, enabling non-destructive measurement of grain orientation while preserving the material's strength characteristics and suitability for service.
Solution Approach 2:
The patent uses an intermediary approach by measuring the stress response of the overlying polycrystalline layer under differential loading conditions. The x-ray diffraction system measures stress in the polycrystalline layer, which indirectly provides information about the grain orientation of the underlying single crystal or directionally solidified material, allowing determination without direct access or destruction of the critical material.
2Reliability
If overlying polycrystalline layer is present, then material can be protected during manufacturing, but direct x-ray diffraction analysis of underlying crystalline material is prevented
Solution Approach 1:
The patent uses the overlying polycrystalline layer itself as an intermediary measurement target. Instead of trying to penetrate or remove the layer to access the underlying crystalline material, the system measures stress in the polycrystalline layer under differential loading, which contains indirect information about the grain orientation of the underlying material. This approach maintains the protective function of the layer while enabling non-destructive measurement.
Solution Approach 2:
The patent changes the measurement parameter from direct crystallographic orientation to stress response under differential loading conditions. By applying differential loads and measuring the resulting stress in the polycrystalline layer through x-ray diffraction, the system can infer grain orientation information without needing direct access to the underlying crystalline structure, thus preserving both the protective layer and the ability to measure orientation.
3Measurement precision
If destructive testing methods are used to determine grain orientation, then accurate orientation data is obtained, but the article cannot be placed into service
Solution Approach 1:
The patent replaces destructive mechanical sectioning or material removal methods with non-destructive x-ray diffraction measurement. The system determines grain orientation by measuring the diffraction pattern of x-rays interacting with the crystalline structure, providing accurate orientation data while leaving the article intact and suitable for placement into service, thereby preserving its full service life.
Solution Approach 2:
The patent uses stress measurement in the overlying polycrystalline layer as an intermediary to obtain grain orientation information without directly disturbing the underlying crystalline material. This indirect measurement approach provides accurate orientation data while maintaining the integrity and serviceability of the entire article.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the non-destructive testing of articles, allowing them to be placed into service without altering their strength characteristics, providing accurate determination of grain orientation and ensuring the material's properties meet desired specifications.
Implementation Method 1
an x-ray diffraction system and method are provided including an x-ray emitter for directing x-rays at a held article... a controller operably connected to the x-ray diffraction device... for non-destructively determining a material characteristic of an underlying material of an article under an overlying material
Implementation Method 2
a load applying device for applying different loads to the held article... measuring a material characteristic of an overlying material of the article under the different loads
Data Source
AI summary
A system and method for non-destructively determining the grain orientation of a crystalline material using x-ray diffraction techniques to non-destructively analyze material and, more particularly, to a system and method for determining the grain orientation of an underlying crystalline material covered by an overlying polycrystalline material. Further, the system and method relate to the use of x-ray diffraction to non-destructively characterize parts and components to determine whether to accept or reject those components or parts for use in application.