X-Ray Analysis Operation Guidance Using Virtual Measurement Results

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Solution Overview

Problem

Inexperienced users face difficulties in determining suitable measurement conditions for X-ray analysis, as existing systems struggle to recommend appropriate measuring optical systems and control conditions for various samples.

Innovation Solution

An operation guide system and method that includes a control unit with a CPU, storage, and input/output devices, which guides users through selecting analysis purposes, inputting sample information, acquiring and evaluating measurement conditions, and simulating virtual results to recommend optimal measurement conditions based on the sample's characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the X-ray analysis apparatus provides a database of measuring optical systems and control conditions for various samples, then the versatility and adaptability of the system improves, but the device complexity and difficulty of managing the database increases

Engineering Contradiction:
Improveadaptability to different samplesVSAvoidcomplexity of measurement condition database
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent segments the measurement condition database into multiple classification categories including sample state (solid, liquid, powder, film), analysis method (diffraction, fluorescence, absorption), and measurement purpose (phase identification, quantitative analysis, residue analysis). This segmentation allows the system to manage complex data through organized classification while maintaining high adaptability to different sample types and analysis requirements

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a control unit that acts as an intermediary between the user and the measurement condition database. The control unit automatically selects appropriate measuring optical systems and control conditions based on sample information input by the user, eliminating the need for users to directly navigate or manage the complex database structure while preserving full access to diverse measurement conditions

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If the system recommends specific measuring optical systems and control conditions to users, then the ease of operation improves, but the measurement precision and reliability may be compromised due to automated selection

Engineering Contradiction:
Improveease of setting measurement conditionsVSAvoidreliability of recommended measurement conditions
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent implements feedback mechanisms where the control unit provides recommended measurement conditions to users, and users can review, modify, or select alternative conditions. The system also provides feedback on the suitability of recommended conditions based on the specific sample characteristics, allowing users to verify the appropriateness of automated recommendations before execution

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system enables users to input their own sample information and requirements, allowing them to actively participate in the selection process. The control unit then uses this user-provided information to generate tailored recommendations, combining automated expertise with user-specific knowledge to ensure both ease of operation and reliability of the selected measurement conditions

Inventive Principle:
Principle #25Self-service

Data Source

PatentEP3128316B1Operation guide system for x-ray analysis and operation guide method therefor
Publication Date: 2021.02.17 RIGAKU CORP
  • EP3128316B1 patent drawingFigure 1
  • EP3128316B1 patent drawingFigure 2
  • EP3128316B1 patent drawingFigure 3

AI summary

Provided is an operation guide system for an X-ray analysis, including: a sample information acquisition portion for acquiring sample information on a sample to be measured for a predetermined analysis purpose with an X-ray measuring unit; a measurement condition acquisition portion for acquiring a plurality of measurement conditions different fromone another; a virtual result acquisition portion for subjecting the sample information to simulations respectively based on the plurality of measurement conditions, to thereby acquire a plurality of virtual measurement results of measurements for the predetermined analysis purpose; and a comparison result output portion for outputting, as comparison results, at least two virtual measurement results among the plurality of virtual measurement results and at least two of the plurality of measurement conditions respectively corresponding to the at least two virtual measurement results.