X-ray Image Processing Using 3D Surface Data for Single-Exposure Material Decomposition

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Solution Overview

Problem

Current X-ray imaging methods require multiple exposures to obtain information about stereoscopic structures and material characteristics, leading to increased radiation dose and reduced image quality due to patient movement, and are unable to accurately measure material information from a single X-ray image.

Innovation Solution

An X-ray image processing method and apparatus that uses a single X-ray image with a single energy band to obtain three-dimensional information and decompose materials like soft tissue and bone, allowing for the measurement of thickness, volume, and areal density, while performing scatter correction to improve image quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple X-ray imaging operations are performed to obtain stereoscopic structure information and material characteristics, then measurement precision and information completeness are improved, but radiation dose increases and image quality deteriorates due to patient movement

Engineering Contradiction:
Improvematerial information measurement accuracyVSAvoidradiation dose
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent transforms the physical state of X-ray imaging from multiple exposure operations to a single exposure operation by changing the imaging parameters. Specifically, it uses a single X-ray image combined with 3D surface information to perform material decomposition and stereoscopic structure measurement, thereby reducing radiation dose while maintaining measurement precision through computational methods rather than repeated physical exposures

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces 3D surface information as an intermediary element that bridges the gap between a single 2D X-ray projection and the desired 3D material characterization. This intermediary 3D surface data enables the system to recover depth information and perform accurate material decomposition without requiring multiple X-ray exposures from different angles

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If multiple X-ray imaging operations are performed to obtain stereoscopic structure information, then measurement precision is improved, but image quality deteriorates due to patient movement

Engineering Contradiction:
Improvestereoscopic structure measurement accuracyVSAvoidimage quality
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent performs preliminary acquisition of 3D surface information before or during the single X-ray imaging operation. This preliminary 3D surface data is then used to correct and enhance the single X-ray projection, enabling accurate stereoscopic structure measurement without requiring the patient to remain stationary during multiple exposures. The preliminary action of capturing surface geometry allows the system to compensate for movement artifacts that would otherwise degrade image quality

Inventive Principle:
Principle #10Preliminary action

3Object-affected harmful factors

If a single X-ray image is used to obtain material information, then radiation dose is minimized, but measurement precision deteriorates due to insufficient material decomposition capability

Engineering Contradiction:
Improveradiation doseVSAvoidmaterial information measurement accuracy
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The patent transitions from analyzing a single 2D X-ray projection to utilizing 3D surface information in conjunction with the 2D image. By incorporating the third dimension (depth/surface geometry) through 3D camera data, the system enables accurate material decomposition and thickness measurement from a single X-ray exposure, thereby maintaining measurement precision while minimizing radiation dose

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Measurement precision

If multiple X-ray images with multiple energy bands are used to obtain material characteristics, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvematerial characteristics measurement accuracyVSAvoidimaging system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses 3D surface information as an intermediary that enables material decomposition and characteristics measurement from a single-energy-band X-ray image. This intermediary 3D data compensates for the lack of multi-energy-band information, allowing the system to achieve material characterization accuracy comparable to or exceeding multi-energy methods without requiring complex multi-energy imaging hardware

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables accurate and rapid measurement of material information from a single X-ray image, minimizing radiation dose and image degradation, and providing detailed stereoscopic structure analysis of multiple materials within the object.

Implementation Method 1

an X-ray apparatus may obtain an X-ray image of an object by transmitting X-rays emitted from an X-ray source through the object and detecting an intensity difference between the transmitted X-rays by using an X-ray detector

Methodology Applied
Scientific EffectX-ray transmission and detection: X-Ray

Implementation Method 2

obtaining three-dimensional (3D) information about the object using a 3D camera

Methodology Applied
Scientific Effect3D imaging:

Implementation Method 3

performing scatter correction on the first X-ray image

Methodology Applied
Scientific EffectX-ray scatter correction: Scattering

Data Source

PatentUS11373308B2X-ray image processing method and X-ray image processing apparatus
Publication Date: 2022.06.28 SAMSUNG ELECTRONICS CO LTD
  • US11373308B2 patent drawing
  • US11373308B2 patent drawing
  • US11373308B2 patent drawing

AI summary

An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material different from the first material; obtaining three-dimensional (3D) information about the object using a 3D camera; obtaining first information about a thickness of the object based on the 3D information; and obtaining second information related to a stereoscopic structure of the first material by decomposing the first material from the object using the first information and the first X-ray image.