X-ray Imaging Device Electron Beam Control
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Solution Overview
Problem
Existing X-ray imaging devices using multiple nano-emitters struggle to produce clear X-ray images due to overlapping and dislocated emission points, leading to poor image clarity.
Innovation Solution
An X-ray imaging device comprising an electron beam generation unit with multiple nano-emitters, a focusing electrode, a deflector, a limited electrode with a restricted aperture, and an image acquisition unit, where the deflector optimizes electron beam deflection and the limited electrode controls electron beam passage to minimize overlapping and enhance focal spot precision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple nano-emitters are provided to increase electron beam generation capacity, then productivity is improved, but manufacturing precision deteriorates due to overlapping and dislocated emission points
Solution Approach 1:
The patent segments the electron beam control process into distinct functional stages: generation by multiple nano-emitters, focusing by the first focusing electrode, deflection by the deflector, and final selection through the limited aperture. This segmentation allows each component to perform its specific function optimally, resolving the contradiction between using multiple emitters and maintaining precision.
Solution Approach 2:
The first focusing electrode performs preliminary focusing of electron beams from multiple nano-emitters before they reach the deflector and limited aperture. This preliminary action organizes the beams in advance, enabling subsequent precise selection and deflection, thus maintaining manufacturing precision while utilizing multiple emitters for higher productivity.
2Manufacturing precision
If a limited aperture is introduced to select single electron beams and improve image clarity, then manufacturing precision is improved, but device complexity increases
Solution Approach 1:
The limited electrode serves multiple functions: it acts as an aperture to select single electron beams, a detector to measure current intensity, and a positioning reference for the deflector. This multi-functionality reduces the need for separate components, thereby limiting the increase in device complexity while achieving improved image clarity.
Solution Approach 2:
The limited aperture acts as an intermediary element between the electron beam generation system and the anode. It selectively transmits only the desired electron beam while blocking others, thus improving image clarity without requiring direct complex control mechanisms between the emitters and the target.
3Ease of operation
If deflector and limited electrode are added to control electron beam passage, then ease of operation is improved, but device complexity increases
Solution Approach 1:
The limited electrode measures the current intensity of electron beams and provides feedback information. This feedback enables the control system to identify and select the electron beam with the largest current magnitude, improving ease of operation by automating the selection process rather than requiring manual adjustment of multiple parameters.
Solution Approach 2:
The deflector dynamically adjusts the position of electron beams based on real-time conditions, and the limited aperture dynamically selects which beam to transmit based on current intensity measurements. This dynamic control improves ease of operation by adapting to varying beam conditions automatically.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables the acquisition of clear X-ray images by ensuring that only one electron beam with the largest current magnitude passes through the limited aperture, resulting in improved image clarity and reduced overlapping, thus enhancing the resolution of X-ray images.
Implementation Method 1
an electron beam generation unit including a plurality of nano-emitters 13a to 13d and a cathode 11
Implementation Method 2
a first focusing electrode configured to focus an electron beam emitted from the electron beam generation unit
Implementation Method 3
a deflector configured to deflect the electron beam focused by the first focusing electrode
Implementation Method 4
an anode configured to be irradiated with the electron beam to emit an X-ray
Data Source
AI summary
Provided is an X-ray imaging device and a driving method thereof, the X-ray imaging device including an electron beam generation unit including a plurality of nano-emitters and a cathode, a first focusing electrode configured to focus an electron beam emitted from the electron beam generation unit, a deflector configured to deflect the electron beam focused by the first focusing electrode, a limited electrode configured to limit traveling of the electron beam deflected by the deflector, and an anode configured to be irradiated with the electron beam to emit an X-ray, wherein the limited electrode includes a limited aperture which the electron beam pass.