X-ray Inspecting Apparatus Parallel Detector Movement
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Solution Overview
Problem
Current X-ray inspection methods are inefficient for high-speed, one-hundred percent inspection of products, particularly in inline manufacturing, due to the need for extensive image pick-up and 3D rendering time, and require complex mechanisms with many movable parts, leading to increased costs and reduced maintainability.
Innovation Solution
An X-ray inspecting apparatus with a plurality of X-ray detectors and a control unit that allows independent movement of these detectors, enabling parallel image pick-up and movement, reducing the number of movable parts and optimizing image reconstruction based on X-ray intensity distribution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single X-ray detector is used for inspection, then the apparatus structure is simple, but the inspection time is long and productivity is low
Solution Approach 1:
The patent divides the inspection system into multiple independent X-ray detectors arranged in parallel. Each detector inspects a specific region simultaneously, enabling parallel processing of multiple object portions. This segmentation of the detection function directly increases inspection throughput without requiring complex coordinated movement mechanisms.
Solution Approach 2:
The patent transitions from sequential single-point inspection to multi-point simultaneous inspection by adding spatial dimensionality through multiple detectors. This dimensional expansion allows the system to inspect multiple regions across different spatial positions at the same time, dramatically improving productivity while keeping each detector relatively simple.
2Productivity
If multiple X-ray detectors are used for parallel inspection, then inspection speed increases, but the number of movable parts increases and device complexity increases
Solution Approach 1:
The patent merges the control and movement functions into a unified system where a single control unit coordinates multiple detectors. The detectors are positioned to share common support structures and control systems, reducing redundant movable parts. This merging approach allows parallel inspection while minimizing the increase in device complexity.
Solution Approach 2:
The control unit serves multiple functions: it controls all X-ray detectors, manages data from all detectors, and coordinates their operations. This multi-functionality reduces the need for separate control systems for each detector, thereby reducing overall device complexity while maintaining high inspection speed through parallel operation.
3Adaptability or versatility
If X-ray detectors are moved to different positions for comprehensive inspection, then inspection coverage is improved, but inspection time increases
Solution Approach 1:
The patent positions multiple X-ray detectors in advance at optimal locations that provide comprehensive inspection coverage. This preliminary arrangement of detectors eliminates the need for time-consuming movement during the inspection process. All detectors are ready simultaneously to capture images from their respective positions, achieving both comprehensive coverage and rapid inspection.
Solution Approach 2:
The patent enables continuous parallel operation of multiple detectors simultaneously capturing images from different positions. This continuous multi-point detection eliminates idle time between sequential measurements. The useful action of image acquisition continues uninterrupted across all detectors, maximizing inspection speed while maintaining comprehensive coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables selective and rapid inspection of prescribed areas, reducing inspection time and costs while maintaining high reliability and simplicity, allowing for high-speed inspection of multiple object portions without moving the object.
Implementation Method 1
an X-ray source (10), for outputting X-rays (18)
Implementation Method 2
a plurality of X-ray detectors (23.1 to 23.N) (N is an integer of 2 or more), for picking-up images on a plurality of detection surfaces
Data Source
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AI summary
An X-ray inspecting apparatus capable of high-speed inspection of a prescribed inspection area of an object of inspection is provided. The X-ray inspecting apparatus (100) includes: a scanning X-ray source (10) for outputting X-ray; an X-ray detector driving unit (22) on which a plurality of X-ray detectors (23) are mounted, and capable of driving the plurality of X-ray detectors (23) independently; and an image acquisition control mechanism (30) controlling acquisition of image data by X-ray detector driving unit (22) and X-ray detectors (23). A scanning X-ray source (10) emits X-ray while moving the X-ray focal point of the X-ray source to each of X-ray emission originating positions set for each X-ray detector (23) such that the X-ray passes through a prescribed inspection area of an object of inspection (20) and enters each X-ray detector (23). Image pick-up by some of the X-ray detectors (23) and movement of other X-ray detectors to an image pick-up position are executed in parallel and alternately. An image acquisition control unit (30) acquires the image data picked-up by X-ray detectors (23), and a computing unit (70) reconstructs an image in the inspection area based on the image data.