X-ray Inspection Device Beveled Frame and Adjustable Conveyor
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing X-ray inspection devices face limitations when performing both oblique view capturing and direct view imaging due to the need for increased X-ray path space, which can restrict the width of printed substrates and increase apparatus size.
Innovation Solution
The X-ray inspection device features a frame with beveled sides along the substrate conveying direction for wider X-ray path opening during oblique view capturing and a dual-end stud mechanism with synchronized nut mechanisms for adjustable conveyor frames, allowing simultaneous movement and simplified drive systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a fixed frame and movable frame configuration is used for clamping substrates, then substrate width adjustment is enabled, but the apparatus size increases when both oblique view capturing and direct view imaging are required
Solution Approach 1:
The substrate table is designed with dynamic adjustability, allowing the table top to be tilted at a predetermined angle for oblique view capturing, while the clamping mechanism can still adjust substrate width. This dynamic configuration enables the same apparatus to handle both oblique and direct view imaging without requiring separate fixed and movable frames for each mode.
2Adaptability or versatility
If a fixed frame is disposed at a position to transmit X-rays for oblique view capturing, then oblique view capturing is enabled, but the width of printed substrates for direct view imaging is restricted
Solution Approach 1:
The substrate table's ability to tilt at a predetermined angle allows the X-ray transmission path to be adjusted dynamically. When tilted, the table creates the necessary angle for oblique view capturing while maintaining adequate substrate width. When in horizontal position, it enables direct view imaging with full substrate width, thus resolving the conflict between oblique view capability and substrate width restriction.
3Length of moving object
If the substrate table is made movable in the substrate width direction, then wider substrate inspection is enabled, but the drive system complexity increases
Solution Approach 1:
The drive system for moving the substrate table in the width direction is merged with the existing clamping mechanism's drive system. By combining these functions into a single integrated drive unit, the patent achieves wider substrate inspection capability without proportionally increasing drive system complexity, as the same actuator serves dual purposes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables wider substrate inspection without size constraints, reduces driving time, and maintains symmetry for efficient X-ray transmission, allowing both oblique and direct view imaging without unnecessary restrictions.
Implementation Method 1
X-rays are irradiated onto an inspection target (a printed substrate) and an X-ray image is captured using these devices
Data Source
Figure 1
Figure 2
Figure 3
AI summary
Provided is an X-ray inspection device, comprising: a pair of conveyor frames (71, 72) that is disposed symmetrically with respect to a center line (120a) as an axis along a substrate conveying direction, and clamps a printed substrate (W) in a substrate width direction; a substrate conveying mechanism that conveys in an X axis direction the printed substrate (W) supported by the conveyor frames (71, 72); and a distance adjustment mechanism (90) that drives the pair of conveyor frames (71, 72) so that the conveyor frames (71, 72) approach or depart from each other in the Y axis direction, thereby adjusting the width dimension of a printed substrate (W) that can be conveyed by the substrate conveying mechanism disposed on each of the conveyor frames (71, 72).