X-ray Inspection System with Pliable Sample Support for 3D Reconstruction
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Solution Overview
Problem
Current x-ray inspection systems are laborious and time-consuming, particularly when securing samples for three-dimensional visualizations, and they often result in inaccurate reconstructions due to sample movement and the need for individual sample inspection.
Innovation Solution
An x-ray inspection system featuring a sample support with a pliable material and a positioning assembly that allows for secure clamping and rotation of samples, enabling accurate three-dimensional reconstructions while allowing multiple samples to be inspected simultaneously.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If samples are secured using a hot glue gun or clamp to reduce movement, then sample stability during rotation is improved, but the inspection process becomes laborious and time-consuming
Solution Approach 1:
The sample is pre-positioned on a sample support structure with positioning features (such as V-grooves, clamps, or fixtures) that automatically secure the sample in the correct orientation and location before rotation begins. This preliminary positioning eliminates the need for time-consuming manual securing operations like hot gluing or clamping during the inspection process.
Solution Approach 2:
The sample support structure is designed to automatically hold and position the sample through self-aligning features such as gravity-assisted positioning, spring-loaded clamps, or geometric constraints. The system serves itself by maintaining sample stability without requiring continuous manual intervention or complex securing procedures.
2Stability of the object's composition
If samples are secured using a hot glue gun or clamp, then sample movement is reduced, but sample damage risk increases
Solution Approach 1:
Instead of using potentially damaging hot glue or tight clamps that could harm expensive or fragile samples, the invention employs disposable or easily replaceable sample supports with gentle holding mechanisms. These supports use soft materials or geometric constraints that secure the sample without applying damaging forces or leaving residues.
Solution Approach 2:
The sample support structure acts as an intermediary between the rotation mechanism and the sample. It provides a protective interface that holds the sample securely while isolating it from direct contact with potentially harmful securing mechanisms, thereby preventing sample damage during the inspection process.
3Measurement precision
If samples are inspected one at a time, then inspection accuracy is maintained, but productivity decreases
Solution Approach 1:
The sample support structure is designed to hold multiple samples simultaneously in predetermined positions, each properly oriented for inspection. The rotation mechanism then inspects all samples in sequence during a single operational cycle, merging multiple inspection tasks into one coordinated process. This maintains individual sample inspection accuracy while dramatically increasing overall productivity by eliminating repeated setup and positioning operations.
4Illumination intensity
If the sample is positioned close to the x-ray source for high magnification, then image magnification is maximized, but collision risk between sample and x-ray source increases
Solution Approach 1:
The system separates the magnification function from the positioning function by using an optimized x-ray optical geometry. The sample support structure positions samples at safe distances from the x-ray source, while high magnification is achieved through specialized detectors, optical magnification systems, or computational imaging techniques. This segmentation allows close effective magnification without physical proximity that would cause collisions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system simplifies and accelerates the inspection process, providing high-quality and accurate three-dimensional reconstructions of samples, even large or heavy ones, while reducing the risk of collisions and allowing for high magnification and simultaneous inspection of multiple samples.
Implementation Method 1
a sample support comprising a pliable material... at least one surface of the sample is in contact with the pliable material
Implementation Method 2
By placing a sample between an x-ray source such as an x-ray tube and an x-ray detector, a two-dimensional image of a section through the sample can be captured
Implementation Method 3
the sample is rotated with respect to the x-ray source and x-ray detector, or vice versa, between images. A three-dimensional reconstruction of the sample can then be computed by combining the two-dimensional images
Data Source
AI summary
An x-ray inspection system comprising an x-ray source, an x-ray detector, a sample support comprising a pliable material and a sample support positioning assembly configured to position the sample support between the x-ray source and the x-ray detector. The sample support is configured to removably clamp a sample for inspection in a fixed position with respect to the sample support and configured so that, in use, at least one surface of the sample is in contact with the pliable material. The sample support positioning assembly comprises a rotational drive configured to rotate the sample support about a rotational axis. This allows the sample to be rotated about a rotational axis such that a series of two-dimensional images can be captured by the x-ray detector that can be used to create a three-dimensional reconstruction of the sample.