X-ray Interferometric Imaging System with Microstructured Target

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current x-ray interferometric imaging systems, such as Talbot-Lau interferometers, face challenges with low x-ray flux and limited spatial coherence, leading to long exposure times and increased radiation doses, especially for clinical applications requiring high-energy x-rays and two-dimensional phase-contrast imaging.

Innovation Solution

An x-ray interferometric imaging system utilizing a target with microstructured x-ray generating materials embedded in a thermally conducting substrate of low atomic number, such as diamond or beryllium, to produce high-brightness, spatially coherent x-ray sub-sources, allowing for simultaneous two-dimensional phase-contrast imaging with reduced exposure times and radiation dose.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional x-ray sources are used in Talbot-Lau interferometers, then the system can perform phase-contrast imaging, but the x-ray flux is low and exposure times are long

Engineering Contradiction:
Improveimage acquisition speedVSAvoidx-ray flux
Core Design Contradiction:
ProductivityVSQuantity of substance

Solution Approach 1:

The x-ray target is segmented into multiple discrete microstructures (e.g., micropillars, microcolumns) arranged in an array, where each microstructure acts as an independent x-ray generating element. This segmentation allows the electron beam to be distributed across multiple small focal spots, increasing the total x-ray flux while maintaining spatial coherence from each individual microstructure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The target uses composite construction with microstructures of high atomic number material (e.g., tungsten, molybdenum) embedded in a substrate of low atomic number material with high thermal conductivity (e.g., diamond, beryllium, copper). This composite structure optimizes both x-ray generation efficiency (from the high-Z microstructures) and heat dissipation (from the low-Z substrate), enabling higher power operation and increased x-ray flux.

Inventive Principle:
Principle #40Composite materials

2Power

If higher electron density is used to increase x-ray brightness, then image acquisition speed improves, but heat management becomes difficult

Engineering Contradiction:
Improvex-ray brightnessVSAvoidheat dissipation
Core Design Contradiction:
PowerVSTemperature

Solution Approach 1:

The target structure assigns different functional properties to different regions: the microstructures have high atomic number for efficient x-ray generation, while the substrate has high thermal conductivity for heat dissipation. This local differentiation of material properties allows the system to handle high electron densities and power loads effectively.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The low atomic number substrate acts as an intermediary between the high-Z x-ray generating microstructures and the cooling system. It efficiently conducts heat away from the microstructures while being transparent to x-rays, enabling high power operation without compromising thermal management.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Quantity of substance

If microstructured targets are used to increase x-ray flux, then brightness improves, but manufacturing complexity increases

Engineering Contradiction:
Improvex-ray fluxVSAvoidtarget fabrication
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The invention specifies optimal parameter ranges for the microstructures (size, spacing, shape, depth) and substrate properties (thermal conductivity, atomic number, thickness) that balance x-ray flux generation with manufacturability. These parameter optimizations make the fabrication process more predictable and achievable using standard microfabrication techniques.

Inventive Principle:
Principle #35Parameter changes

4Temperature

If low atomic number substrates are used for heat conduction, then thermal management improves, but x-ray absorption increases

Engineering Contradiction:
Improveheat conductionVSAvoidx-ray absorption
Core Design Contradiction:
TemperatureVSObject-affected harmful factors

Solution Approach 1:

The substrate thickness is optimized to be thin enough to allow most x-rays to pass through with minimal absorption, while still providing sufficient thermal conductivity for heat dissipation. This parameter optimization resolves the trade-off between thermal management and x-ray transmission efficiency.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system achieves higher x-ray brightness and power, enabling faster image acquisition with lower radiation doses by using thermally conducting substrates to manage heat and enhance electron density, while maintaining high spatial coherence for improved image contrast.

Implementation Method 1

anodes or targets comprising periodic microstructures of x-ray generating materials embedded in a thermally conducting substrate

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

The initial discovery of x-rays by Röntgen in 1895 occurred when Röntgen was experimenting with electron bombardment of targets in vacuum tubes

Methodology Applied
Scientific EffectX-ray generation through electron impact: X-Ray

Implementation Method 3

The method relies on the well-known Talbot interference effect, originally observed in 1837 and fully explained by Lord Rayleigh in 1881

Methodology Applied
Scientific EffectTalbot interference effect: Interference

Data Source

PatentEP3136970B1X-ray interferometric imaging system
Publication Date: 2020.11.04 SIGRAY INC
  • EP3136970B1 patent drawingFigure 1
  • EP3136970B1 patent drawingFigure 2
  • EP3136970B1 patent drawingFigure 3

AI summary

An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.