AI X-Ray Landmark Measurement for Faster Anatomical Quantification
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Solution Overview
Problem
Existing X-ray imaging systems require significant computational complexity and time to calculate accurate anatomical measurements due to complex geometric and trigonometric post-processing, necessitating a more efficient method.
Innovation Solution
An AI-based measurement system overlays key features corresponding to anatomical landmarks in X-ray images, allowing direct calculation of measurements using known relationships between these features, reducing computational complexity and time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex geometric and trigonometric post-processing algorithms are used to calculate anatomical measurements, then measurement precision is improved, but computational complexity and processing time increase significantly
Solution Approach 1:
The patent creates a simplified copy of the anatomical structure by detecting key landmarks and constructing a geometric model with predefined relationships. This model copies the essential measurement characteristics while eliminating the need for complex post-processing algorithms, thereby reducing computational complexity while maintaining measurement precision.
Solution Approach 2:
The patent segments the complex anatomical measurement problem into discrete key landmarks and their geometric relationships. By identifying specific landmark points and using their predefined spatial relationships, the system breaks down the complex measurement calculation into simpler, more manageable computations.
2Measurement precision
If multiple AI models perform separate anatomy segmentations that are stitched together, then measurement precision is improved, but processing time and system complexity increase
Solution Approach 1:
The patent merges the functions of multiple separate AI models into a single integrated system that simultaneously detects all key landmarks and constructs the geometric model. This consolidation eliminates the time required for stitching multiple segmentations while maintaining the precision benefits of multi-model approaches.
Solution Approach 2:
The patent performs preliminary detection of key landmarks and construction of geometric relationships during the same processing step, rather than sequentially performing segmentation followed by measurement calculation. This preliminary action eliminates subsequent processing steps and reduces overall processing time.
3Measurement precision
If comprehensive anatomy landmark segmentation is performed, then measurement precision is improved, but processing requirements and time increase
Solution Approach 1:
The patent extracts only the essential key landmarks and their geometric relationships from the complete anatomical structure. By focusing on these critical elements rather than processing every anatomical detail, the system maintains measurement precision while significantly improving processing speed and reducing computational requirements.
Data Source
AI summary
An artificial intelligence (AI) measurement system for an X-ray image is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to automatically scan post-exposure X-ray images to detect and locate various landmarks of the anatomy presented within the X-ray image. A set of key image features approximating the locations of the landmarks having known distance relationships to one another is overlaid onto the X-ray image. The positions of the key image features are then adjusted to correspond to the landmarks within the X-ray image. These adjustments are made relative to the prior known distance relationships between the key features, which enables the measurement system to readily calculate desired angular and length measurements between landmarks as a result.