3D X-Ray Inspection Layout for Aviation Pallet Cargo
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Solution Overview
Problem
Existing inspection methods for aviation pallet cargo face challenges such as image overlap, limited scanning angles, low pass rates, high labor costs, and high manufacturing costs, particularly in systems using single-view X-ray, multi-view X-ray, CT scanning, and dynamic/static CT scanning systems.
Innovation Solution
An inspection system with rotatable ray sources and detector assemblies that lift or lower along a vertical axis, allowing for combined scanning angles greater than 180 degrees, and reconstruct three-dimensional scanning images, using distributed ray sources with separate housings and detector units arranged to avoid blocking, and a conveyor system for efficient object handling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If single-view X-ray inspection is used, then the inspection system is simple, but image overlap occurs and scanning angle is limited
Solution Approach 1:
The inspection system divides the single X-ray source into multiple ray sources (first ray source, second ray source, third ray source) positioned at different locations. Each ray source emits X-rays through different paths, creating separate X-ray images that avoid overlap. This segmentation of the imaging function allows the system to maintain simplicity while improving image quality by eliminating superposition artifacts.
Solution Approach 2:
The patent introduces a vertical dimension by positioning ray sources at different heights (first ray source at upper height, second ray source at lower height, third ray source at upper height). This three-dimensional arrangement of ray sources and detectors creates spatial separation between X-ray paths, enabling the system to scan objects from multiple angles without image overlap while maintaining relatively simple individual imaging components.
2Measurement precision
If multi-view X-ray inspection is used, then scanning angle improves, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent combines multiple ray sources and detector assemblies into a single integrated inspection system with a unified support structure and control mechanism. The first, second, and third ray sources are mounted on the same support structure with coordinated movement, sharing common infrastructure for positioning and control. This merging approach achieves multi-view scanning capability while minimizing the complexity increase that would result from completely separate imaging systems.
Solution Approach 2:
The inspection system is designed so that the ray sources and detector assemblies can perform multiple functions: the same structural components support all three ray sources, the conveyor system handles all inspection operations, and the control system coordinates all imaging functions. This multi-functionality allows the system to achieve comprehensive scanning angles without proportionally increasing complexity in each individual component.
3Measurement precision
If CT scanning is used, then three-dimensional imaging is achieved, but manufacturing cost and device complexity are high
Solution Approach 1:
Instead of using a single complex CT scanner, the patent segments the imaging function into multiple simpler X-ray sources (first, second, and third ray sources) positioned at different locations. Each source contributes to the three-dimensional reconstruction through its unique viewing angle, achieving CT-quality imaging without requiring a single expensive, complex CT system. The segmented approach allows for lower-cost individual components that collectively provide sophisticated three-dimensional imaging.
4Productivity
If dynamic CT scanning is used, then inspection efficiency improves, but device complexity and maintenance cost increase
Solution Approach 1:
The patent implements dynamic inspection capability by making the ray sources and detector assemblies movable rather than fixed. The first, second, and third ray sources can be positioned at different heights and angles, and the detector assemblies can be adjusted accordingly. This dynamic reconfigurability allows the system to adapt to different object sizes and shapes, improving inspection efficiency and coverage without requiring the complex, rigid infrastructure of traditional dynamic CT scanners.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances inspection efficiency and accuracy by reducing image overlap, improving automatic recognition of prohibited items, and minimizing manufacturing and maintenance costs while handling large-sized aviation pallets.
Implementation Method 1
at least one ray source configured to emit X-rays
Data Source
AI summary
An inspection system, including: a carrying device; at least one ray source and a detector assembly. When the at least one ray source is located at one of scanning positions relative to the carrying device, the at least one ray source and the detector assembly are lifted or lowered along the rotation axis relative to the carrying device and the at least one ray source emits X-rays. After the at least one ray source and the detector assembly are lifted or lowered a predetermined distance relative to the carrying device, the at least one ray source rotates around the rotation axis relative to the carrying device to another one of scanning positions. The inspection system further reconstructs a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly.