X-ray Load Inspection Using Attenuation Coefficient Labeling
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing load inspection methods, particularly those using X-ray radiography, face challenges in accurately distinguishing materials in complex loads due to variations in thickness and arrangement, leading to imprecise determination of atomic numbers and unreliable results.
Innovation Solution
A method that assigns labels to pixels in a load's digitized image using global and local statistical tests, categorizing materials as 'organic' or 'inorganic' without relying on atomic number determination, and combining this information with atomic number data for enhanced characterization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If methods based on atomic number determination are used to inspect loads, then material differentiation capability is improved, but measurement precision deteriorates in complex loads due to variations in thickness and arrangement
Solution Approach 1:
The patent changes the parameter being measured from atomic number to attenuation coefficient, which directly characterizes material interaction with X-rays. By using the relationship μ = ρ * (μ/ρ) where μ is attenuation coefficient, ρ is density, and (μ/ρ) is mass attenuation coefficient, the method achieves reliable material identification without being affected by thickness variations that plague atomic number determination methods
Solution Approach 2:
The patent replaces the complex atomic number determination system with a simpler attenuation coefficient measurement system. Instead of attempting to extract atomic number Z from attenuation data (which requires complex calculations and is sensitive to thickness variations), the method directly uses attenuation coefficients at different energies to identify materials, substituting a problematic measurement approach with a more robust one
2Adaptability or versatility
If dual-energy X-ray systems are used to determine atomic numbers, then material characterization is improved, but device complexity increases
Solution Approach 1:
The patent makes the detection system universal by showing that the attenuation coefficient measurement method works with both single-energy and dual-energy systems. The core algorithm remains the same, adapting to whatever energy configuration is available, thus providing multi-functionality without requiring complex dual-energy hardware
Solution Approach 2:
The patent changes the approach from requiring dual-energy systems for material characterization to using attenuation coefficients that can be derived from single-energy measurements. By establishing the relationship between attenuation coefficient and material properties, the method achieves effective material characterization without the complexity of dual-energy hardware
3Adaptability or versatility
If complex calculations are performed to determine atomic numbers, then material identification capability is improved, but processing time increases
Solution Approach 1:
The patent substitutes complex atomic number determination calculations with simpler attenuation coefficient measurements and comparisons. Instead of performing lengthy calculations to extract atomic number Z, the method directly measures attenuation coefficients at different energies and compares them to known material values, dramatically reducing processing time while maintaining identification capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the inspection process, improves relevance, and provides reliable material identification in complex loads, even with mono-energy X-ray systems, by focusing on material categories rather than precise atomic numbers.
Implementation Method 1
a source emits X-ray pulses to illuminate successive slices of the load. The radiation transmitted by the load passes through receiving sensors located along the path of the incident beam
Implementation Method 2
The receiving sensors measure the received X-ray dose. The signals transmitted by the receiving sensors are converted into pixel values to form a column of the digitized image
Implementation Method 3
X-rays are generally obtained by the phenomenon known as Bremstrahlung, or 'braking radiation', for example by directing a stream of electrons accelerated to a given kinetic energy, typically a few MeV, onto a metallic target. The deceleration of the electrons in the target causes the emission of X-ray photons
Implementation Method 4
Materials transmit X-rays differently depending on their energies, and it is possible to deduce information about the chemical nature of the materials from this differential behavior. For a given material, the measured attenuation signal is a function of both the material's thickness, its density, and its chemical nature (atomic number Z) via its attenuation coefficient
Data Source
Figure 1~2
Figure 3~5
Figure 4
AI summary
The invention relates to a method (100) for inspecting a load (15), including the following steps: obtaining (102) at least one digitized image (20) of the load using a system for detection by means of transmitting X-rays; determining (104) areas of interest (40) of the digitized image from the values of the pixels (32) thereof, the areas of interest being subsets of the digitized image; allocating (106) a label (L) to each pixel of each area of interest, the allocated label being representative of the chemical nature and arrangement of the materials constituting the portion of the load that corresponds to the pixels; and displaying an image showing the labels allocated to the pixels. The allocation of the label to each pixel of each area of interest includes at least one overall statistical test carried out on the basis of the values of a group of pixels in the area of interest to which the pixel belongs, and at least one local test carried out on the basis of the value of the pixel. The invention also relates to the corresponding detection system.