X-Ray Exposure Measurement Field Using Device Marker Geometry
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Solution Overview
Problem
Existing X-ray systems face challenges in achieving optimal image quality in small or complex-shaped image regions of interest due to interference from outside regions within the measurement field, especially when patient movements occur, leading to suboptimal exposure control.
Innovation Solution
Adapting the measurement field using specifically constructed radiopaque device markers to define the exposure control area, considering the shape, size, and number of markers, and incorporating movement models to predict future positions for dynamic imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a generic measurement field is used for exposure control, then the exposure control can be applied to various X-ray recording situations, but the image quality in small or complex-shaped image regions of interest is not optimal due to interference from outside regions
Solution Approach 1:
The patent applies local quality by defining the measurement field dynamically based on the specific geometry and location of the region of interest rather than using a uniform generic field. The collimator is adjusted to match the local requirements of each ROI, ensuring optimal image quality for small or complex-shaped regions while excluding interfering areas from the measurement calculation.
Solution Approach 2:
The measurement field is made dynamic by continuously adapting its boundaries and shape based on real-time identification of device markers and regions of interest. The system automatically adjusts the measurement field geometry to follow the ROI, enabling the exposure control to respond dynamically to changing imaging requirements rather than relying on static predefined fields.
2Ease of operation
If a generic measurement field is used for exposure control, then the system operation is simple, but scattered radiation from outside the region of interest influences the exposure control
Solution Approach 1:
The patent extracts the harmful scattered radiation from the measurement field by dynamically defining boundaries that exclude areas outside the region of interest. The collimator is positioned to physically block scattered radiation paths, and the measurement field is calculated only from pixels within the ROI, separating the useful signal from harmful interference.
Solution Approach 2:
The patent introduces device markers as intermediary objects that serve as reference points for defining the measurement field boundaries. These markers enable the system to automatically identify and delimit the ROI, acting as mediators between the simple generic field approach and the need for precise scattered radiation exclusion.
3Manufacturing precision
If the measurement field is dynamically adapted to device markers, then image quality in regions of interest is optimized, but the device complexity increases due to marker recognition and movement modeling
Solution Approach 1:
The system applies self-service by using the device markers themselves as the basis for defining the measurement field. The markers that are already present on the medical devices serve dual purposes: they indicate device position and simultaneously define the boundaries of the region of interest, eliminating the need for separate ROI segmentation algorithms or additional reference objects.
Solution Approach 2:
The patent implements feedback by continuously tracking device marker positions and using this information to adjust the measurement field boundaries in real-time. The system monitors marker movement and automatically updates the exposure control parameters based on the current marker configuration, creating a closed-loop control system that adapts to changing conditions.
4Manufacturing precision
If patient movements are considered in exposure control, then image quality during dynamic imaging is improved, but the computational requirements and processing time increase
Solution Approach 1:
The patent applies preliminary action by establishing movement models based on device marker trajectories before actual imaging sequences. The system pre-calculates expected marker positions and measurement field boundaries based on observed movement patterns, allowing it to proactively adjust exposure parameters in anticipation of patient movements rather than reacting after images are captured.
Solution Approach 2:
The system uses copying by creating simplified representations of complex movement patterns through movement models. Instead of processing full image sequences to determine exposure parameters, the system copies the essential movement information from device markers into predictive models that can quickly estimate future ROI positions and adjust exposure control without analyzing every pixel.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances image quality by optimizing exposure control, reducing scattered radiation, and minimizing X-ray dose through dynamic collimation and filtration, particularly in dynamic imaging scenarios.
Implementation Method 1
The term device marker is thus intended to mean X-ray markers present on or applied to a device. Such X-ray markers may be specially applied to a device, for example, as a coating of a radiopaque material.
Data Source
AI summary
A computer-implemented method for specifying the measurement field for an exposure control of an X-ray facility includes: receiving an X-ray image by a computer unit for exposure control; recognizing at least one device marker in the X-ray image; establishing an image shape of the at least one device marker; establishing an image position of the at least one device marker; specifying the position and the shape and/or size of the measurement field dependent upon the image position and the image shape of the at least one device marker; and providing measurement field parameter values that indicate the position, the shape, and/or the size of the measurement field.