X-ray Inspection Device Mass Estimation Accuracy
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Solution Overview
Problem
Conventional x-ray mass estimation apparatuses face challenges in accurately estimating material mass due to non-monoenergetic x-ray photon energy and the influence of uncertain factors such as x-ray energy characteristics and image preprocessing, leading to inaccuracies in mass calculation.
Innovation Solution
An x-ray inspection apparatus that includes an irradiation unit, detection unit, sample image obtaining unit, ideal curve generating unit, and curve adjustment unit to generate and adjust an ideal curve representing the relationship between brightness and mass per unit area, allowing for more accurate mass estimation by compensating for uncertain factors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional x-ray mass estimation methods using fixed formulas are used, then the device complexity is low, but the measurement precision deteriorates due to non-monoenergetic x-ray photons and uncertain factors
Solution Approach 1:
The patent applies preliminary action by pre-acquiring standard values for multiple uncertain factors (x-ray tube characteristics, scatter radiation, image preprocessing parameters) before mass estimation. These standard values are stored in advance and selected based on the actual inspection conditions, allowing the system to compensate for uncertainties without adding complex real-time measurement devices.
Solution Approach 2:
The patent changes parameters by selecting appropriate standard values from pre-acquired data based on actual inspection conditions. Instead of using fixed formulas, the system dynamically adjusts parameters such as x-ray tube characteristics, scatter radiation levels, and preprocessing parameters to match the specific inspection scenario, thereby improving accuracy without requiring complex adaptive hardware.
2Reliability
If simple brightness-based mass calculation is used, then the ease of operation is high, but the reliability deteriorates due to influences from x-ray energy characteristics and image preprocessing
Solution Approach 1:
The patent implements feedback by using pre-acquired standard values that represent actual inspection conditions. The system selects standard values based on feedback from the inspection setup (x-ray tube type, preprocessing method, etc.) and applies these to correct the mass estimation, creating a closed-loop system that adapts to different operating conditions without requiring complex real-time adjustments.
Solution Approach 2:
The patent introduces an intermediary element - the standard values - that mediates between the simple brightness measurement and the complex physical realities of x-ray transmission. These standard values act as a bridge, translating raw brightness data into accurate mass estimates by accounting for x-ray energy characteristics and preprocessing effects without requiring the operator to understand or adjust complex parameters.
3Adaptability or versatility
If fixed formulas are used for mass calculation, then the device complexity is low, but the adaptability deteriorates when inspection conditions vary
Solution Approach 1:
The patent prepares multiple sets of standard values in advance for different inspection conditions (different x-ray tubes, preprocessing methods, material types). When inspection conditions change, the system simply selects the appropriate pre-prepared standard values without requiring complex reconfiguration or recalibration, thus achieving high adaptability with minimal added complexity.
Solution Approach 2:
The patent creates a universal system where a single mass estimation apparatus can handle multiple inspection conditions by using a library of standard values. The same hardware and basic formula work across different scenarios - varying x-ray tubes, preprocessing methods, and material types - by simply selecting appropriate standard values, making the system multi-functional without requiring separate equipment for each condition.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus achieves higher accuracy in mass estimation by adjusting the ideal curve based on actual masses, reducing errors caused by uncertain factors and improving the precision of mass calculation compared to conventional methods.
Implementation Method 1
x-rays are irradiated to a measurement target object and the mass of the measurement target object is estimated (calculated) based on the amount of x-rays transmitted through the measurement target object
Implementation Method 2
the value μ denotes a linear mass coefficient determined by x-ray energy and the type of material, indicating that the higher the value is, the greater the amount of x-rays that is absorbed
Data Source
AI summary
In order to provide an x-ray inspection apparatus capable of estimating the mass of material with high accuracy by eliminating the influence of various uncertain factors such as x-ray energy characteristics and specific filter, an x-ray inspection apparatus (10) comprises a sample image obtaining unit (31), an ideal curve generating unit (32), a curve adjustment unit (33), and a mass estimation unit (34) as a function block generated by a control computer (20). The sample image obtaining unit (31) obtains 10 x-ray transmission images of products G each of whose mass is known in advance. The ideal curve generating unit (32) generates a table based on a formula that indicates a relationship between the brightness of an area included in the x-ray transmission images and the estimated mass of the area. The curve adjustment unit (33) refers to the input actual mass of each x-ray transmission image and adjusts the table such that the estimated mass approximates the actual mass. The mass estimation unit (34) determines the estimated mass per unit area based on the post-adjusted table and adds up these masses to determine the total estimated mass of the product (G).