X-Ray Memory Erasure for Automated Non-Functional Device Wiping
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Solution Overview
Problem
Current methods for erasing data from non-volatile memories in electronic devices are cumbersome, require partial functionality of the device, and often result in unnecessary destruction, especially when devices are non-functional, and are not easily automated due to diverse hardware architectures and connection methods.
Innovation Solution
An automated data erasure device using calibrated X-rays to expel trapped electrons from non-volatile memories within an X-ray-proof enclosure, adjusting irradiation parameters based on device type and memory architecture, allowing rapid and reliable data erasure without damaging other components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional software-based data erasure methods are used, then data can be erased from non-volatile memories, but the process requires significant time and partial device functionality, increasing loss of time and device complexity
Solution Approach 1:
The patent replaces the software-based logical erasure process with a physical X-ray irradiation process. Instead of using computer commands to reset bits through logic gates, the invention uses X-ray radiation to physically erase data from non-volatile memory, eliminating the need for software access and device functionality requirements.
Solution Approach 2:
The patent changes the fundamental mechanism of data erasure from electronic/software-based to physical/radiation-based. By controlling X-ray irradiation parameters (power, duration, angle) to match memory types (NAND, NOR, 3D NAND), the system achieves rapid erasure without time-consuming software processes.
2Reliability
If conventional software-based data erasure methods are used, then data can be erased, but device complexity increases due to varied hardware architectures and connection requirements
Solution Approach 1:
The patent creates a universal data erasure system that works across different device types and memory architectures (NAND, NOR, 3D NAND) through a single physical process. The X-ray irradiation cabin can handle various electronic devices without requiring device-specific software or connection interfaces, simplifying the erasure system while maintaining reliability.
3Productivity
If X-ray irradiation is used for data erasure, then data erasure speed increases and automation becomes feasible, but new equipment complexity is introduced
Solution Approach 1:
The patent implements an automated irradiation cabin system that operates independently of device-specific software or human intervention. The system automatically controls X-ray irradiation based on device identification, eliminating manual erasure processes and enabling high-speed automated data destruction across different device types.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient, rapid, and cost-effective data erasure, preserving device components and facilitating automation, reducing waste and environmental impact.
Implementation Method 1
irradiation of said electronic devices by at least one X-ray source confined in an X-ray-tight enclosure of an irradiation cabin capable of successively receiving a plurality of electronic devices
Data Source
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AI summary
The present invention relates to a device and an automated method for erasing data stored in non-volatile memories (M) of electronic devices (A), for example portable devices such as smartphones or tablets, characterized in that they use an irradiation booth (1) comprising at least one X-ray source (S) confined in an X-ray hermetically sealed enclosure and capable of successively receiving a plurality of electronic devices (A) brought into the booth (1) by a conveyor (2), a control unit (CU) controlling the conveyor (2) and said X-ray source (S) to irradiate each of the electronic devices (A) with a controlled power and duration for the erasure of the data contained in the non-volatile memories (M) of said electronic devices (A).