X-ray Inspection System with Optical Position Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods for automated defect detection in workpieces during X-ray inspection in series and mass production are hindered by the need for repositioning workpieces, which disrupts production flow and requires significant system effort, and are not suitable for inline inspection of varying workpiece shapes and sizes.
Innovation Solution
An X-ray inspection system where the X-ray source and detector are moved to align the workpiece to a defined position, using optical detection and correction to ensure accurate alignment without repositioning, allowing for simultaneous movement and efficient inline inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If workpieces are repositioned using a mechanical manipulator before X-ray inspection, then positional accuracy is improved, but production flow is disrupted and system complexity increases
Solution Approach 1:
Instead of moving the workpiece to align with the X-ray system, the patent inverts the approach by moving the X-ray source and detector to align with the workpiece's actual position. This eliminates the need for workpiece repositioning and maintains continuous production flow while achieving accurate inspection alignment
Solution Approach 2:
The patent replaces the mechanical manipulator system with an optical detection system that uses cameras and image processing to detect workpiece position and control the X-ray system's movement, reducing mechanical complexity and improving production efficiency
2Manufacturing precision
If workpieces are repositioned using a mechanical manipulator before X-ray inspection, then positional accuracy is improved, but system complexity increases
Solution Approach 1:
The patent replaces the mechanical manipulator system with an optical detection system that uses cameras and image processing to detect workpiece position and control the X-ray system's movement, reducing mechanical complexity and improving production efficiency
Solution Approach 2:
The patent introduces an optical detection system as an intermediary between the workpiece and the X-ray inspection system. This intermediary detects workpiece position and enables precise control of the X-ray source and detector movement without requiring complex mechanical manipulators
3Productivity
If the X-ray system is stationary and workpieces are moved on a conveyor, then production flow is maintained, but alignment accuracy for varying workpiece shapes deteriorates
Solution Approach 1:
The patent makes the X-ray source and detector movable rather than stationary, allowing them to dynamically adjust their positions based on the actual location and shape of each workpiece. This dynamic adjustment maintains alignment accuracy for varying workpiece shapes while preserving continuous inline inspection capability
Solution Approach 2:
The patent creates a universal inspection system that can handle various workpiece shapes and sizes by combining optical detection with movable X-ray components. The system adapts to different workpiece configurations without requiring separate inspection setups, maintaining both productivity and precision across diverse production scenarios
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces inspection cycles and maintains test accuracy, making it suitable for series or mass production by eliminating the need for repositioning and enabling precise alignment of workpieces within the X-ray inspection system.
Implementation Method 1
the device has means for optically detecting the position of the workpiece and determining a deviation of the position of the workpiece from a defined position of the workpiece between the X-ray source and the X-ray detector
Implementation Method 2
radiographic testing of workpieces using X-rays
Data Source
Figure 1
Figure 2
AI summary
The invention relates to a method for automated defect detection in workpieces (26) using an X-ray inspection system (2) with an X-ray source (6) and an X-ray detector (8), in which the X-ray inspection is carried out with the workpiece (26) in a defined position between the X-ray source (6) and the X-ray detector (8), and in which the workpiece position is optically detected and any deviation from the defined position is determined. The X-ray source (6) and the X-ray detector (8) are moved according to the determined deviation until the workpiece (26) is positioned in the defined position between the X-ray source (6) and the X-ray detector (8).