X-ray Inspection System with Optical Position Correction

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Solution Overview

Problem

Current methods for automated defect detection in workpieces during X-ray inspection in series and mass production are hindered by the need for repositioning workpieces, which disrupts production flow and requires significant system effort, and are not suitable for inline inspection of varying workpiece shapes and sizes.

Innovation Solution

An X-ray inspection system where the X-ray source and detector are moved to align the workpiece to a defined position, using optical detection and correction to ensure accurate alignment without repositioning, allowing for simultaneous movement and efficient inline inspection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If workpieces are repositioned using a mechanical manipulator before X-ray inspection, then positional accuracy is improved, but production flow is disrupted and system complexity increases

Engineering Contradiction:
Improvepositional accuracyVSAvoidproduction flow
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

Instead of moving the workpiece to align with the X-ray system, the patent inverts the approach by moving the X-ray source and detector to align with the workpiece's actual position. This eliminates the need for workpiece repositioning and maintains continuous production flow while achieving accurate inspection alignment

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent replaces the mechanical manipulator system with an optical detection system that uses cameras and image processing to detect workpiece position and control the X-ray system's movement, reducing mechanical complexity and improving production efficiency

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Manufacturing precision

If workpieces are repositioned using a mechanical manipulator before X-ray inspection, then positional accuracy is improved, but system complexity increases

Engineering Contradiction:
Improvepositional accuracyVSAvoidsystem technology
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical manipulator system with an optical detection system that uses cameras and image processing to detect workpiece position and control the X-ray system's movement, reducing mechanical complexity and improving production efficiency

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an optical detection system as an intermediary between the workpiece and the X-ray inspection system. This intermediary detects workpiece position and enables precise control of the X-ray source and detector movement without requiring complex mechanical manipulators

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If the X-ray system is stationary and workpieces are moved on a conveyor, then production flow is maintained, but alignment accuracy for varying workpiece shapes deteriorates

Engineering Contradiction:
Improveinline inspectionVSAvoidalignment accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent makes the X-ray source and detector movable rather than stationary, allowing them to dynamically adjust their positions based on the actual location and shape of each workpiece. This dynamic adjustment maintains alignment accuracy for varying workpiece shapes while preserving continuous inline inspection capability

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent creates a universal inspection system that can handle various workpiece shapes and sizes by combining optical detection with movable X-ray components. The system adapts to different workpiece configurations without requiring separate inspection setups, maintaining both productivity and precision across diverse production scenarios

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces inspection cycles and maintains test accuracy, making it suitable for series or mass production by eliminating the need for repositioning and enabling precise alignment of workpieces within the X-ray inspection system.

Implementation Method 1

the device has means for optically detecting the position of the workpiece and determining a deviation of the position of the workpiece from a defined position of the workpiece between the X-ray source and the X-ray detector

Methodology Applied
Scientific EffectOptical detection:

Implementation Method 2

radiographic testing of workpieces using X-rays

Methodology Applied
Scientific EffectX-ray: X-Ray

Data Source

PatentEP3040713B2Device for automatically recognising errors on workpieces
Publication Date: 2021.08.04 VISICONSULT GES FUR BILDVERARBEITUNG & AUTOMATISIERUNG MBH
  • EP3040713B2 patent drawingFigure 1
  • EP3040713B2 patent drawingFigure 2

AI summary

The invention relates to a method for automated defect detection in workpieces (26) using an X-ray inspection system (2) with an X-ray source (6) and an X-ray detector (8), in which the X-ray inspection is carried out with the workpiece (26) in a defined position between the X-ray source (6) and the X-ray detector (8), and in which the workpiece position is optically detected and any deviation from the defined position is determined. The X-ray source (6) and the X-ray detector (8) are moved according to the determined deviation until the workpiece (26) is positioned in the defined position between the X-ray source (6) and the X-ray detector (8).