X-ray Optics Alignment Mechanism for Thermal Drift Compensation
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Solution Overview
Problem
Existing X-ray fluorescence analyzers face challenges in aligning and adjusting X-ray optics to the X-ray source, particularly due to heat-induced drifts during operation, which affects the intensity and focus of the X-ray radiation.
Innovation Solution
An adjusting device comprising a mounting frame with displaceable frames and actuators allows for precise alignment of the X-ray optics in a plane perpendicular to the beam axis, enabling easy adjustment and realignment with the X-ray source.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the X-ray optics is fixed in position, then the device structure is simple, but the alignment between X-ray optics and X-ray source deteriorates due to heat-induced drift
Solution Approach 1:
The patent applies the dynamics principle by transforming the fixed X-ray optics into a movable system. The adjusting device with two displaceable frames allows the X-ray optics to be dynamically repositioned in two independent directions, enabling realignment after thermal drift occurs during operation. This resolves the contradiction by making the system adaptable rather than static.
Solution Approach 2:
The adjusting device is segmented into multiple independent components: a mounting frame, a first displaceable frame, and a second displaceable frame. Each frame can be adjusted independently in different directions, allowing fine-tuned alignment of the X-ray optics. This segmentation enables complex adjustment capabilities while maintaining modular simplicity.
2Manufacturing precision
If the X-ray optics is made adjustable, then the alignment precision is improved, but the device complexity increases
Solution Approach 1:
The patent introduces a second dimension of adjustment by adding the second displaceable frame that moves in a direction different from the first frame. This two-dimensional adjustment capability significantly improves alignment precision by allowing independent correction in multiple directions, while the modular frame structure keeps the complexity manageable.
3Productivity
If the intensity of X-ray radiation is increased, then the counting rate of fluorescence radiation is improved, but the heat development in X-ray source increases causing drift
Solution Approach 1:
The adjusting device provides a feedback mechanism for maintaining optimal alignment. After thermal drift occurs due to heat development from high-intensity operation, the system can be readjusted using the displaceable frames to realign the X-ray optics with the X-ray source, ensuring continued high counting rate performance despite temperature changes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for a high-intensity focus of X-ray radiation on a measuring point, enhancing the counting rate of X-ray fluorescence radiation and improving the evaluation of measurement results, such as layer thickness measurements and material analysis.
Implementation Method 1
The X-ray optics for focusing the X-rays can be easily aligned and adjusted to the X-ray source
Implementation Method 2
The secondary radiation emitted by the object to be measured is detected by a detector
Data Source
AI summary
Adjustment device for an X-ray optics in an X-ray fluorescence analyzer and X-ray fluorescence analyzer which comprises an X-ray source for generating an X-ray radiation which is focused with the X-ray optics onto a measurement object and with a detector by which an X-ray fluorescence radiation reflected by the measurement object can be detected, wherein a mounting frame is provided which accommodates a first frame which can be displaced in a first direction with respect to the mounting frame and with a second frame which is guided on the first frame so as to be displaceable in a second direction, wherein the first and second directions of the displacement movement of the frames differing from one another, in that a through opening is provided which extends through the mounting frame, the first frame and the second frame, and in that the X-ray optics can be arranged in the through opening.


