X-ray Detecting Panel Asymmetric Thin Film Transistor Offset Compensation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current X-ray flat panel detectors experience a 'whitening' or 'blackening' phenomenon due to manufacturing errors in thin film transistors, leading to inaccurate gray scale values in images, which complicates medical diagnosis.
Innovation Solution
The X-ray detecting panel features an array substrate with thin film transistors disposed on opposite sides of photosensitive cells, intersecting gate and signal lines, and a scintillation layer to convert X-rays into visible light, along with an image signal processing circuit to balance detection signal offsets and alleviate image distortion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If thin film transistors are disposed at the same position in all photosensitive cells, then manufacturing is simplified, but detection signal offsets occur due to manufacturing errors causing image distortion
Solution Approach 1:
The patent applies asymmetry by alternating the position of thin film transistors between left side and right side of photosensitive cells in adjacent rows. This asymmetric arrangement compensates for manufacturing errors in gate lines, reducing detection signal offsets and improving image quality without significantly complicating the manufacturing process.
2Measurement precision
If thin film transistors are alternately disposed on opposite sides of photosensitive cells, then detection signal offsets are reduced, but device complexity increases
Solution Approach 1:
The patent segments the array substrate into multiple photo-sensitive cells arranged in rows and columns, with each cell containing a thin film transistor. By dividing the overall structure into manageable units with alternating transistor positions, the patent achieves signal uniformity while keeping individual cell structures relatively simple and manageable.
3Ease of manufacture
If all thin film transistors are positioned on the same side, then routing is simplified, but gray scale values become inaccurate due to signal offsets
Solution Approach 1:
The patent inverts the conventional approach by alternating transistor positions between left and right sides rather than keeping them all on one side. This inversion strategy compensates for systematic manufacturing errors in gate lines, improving gray scale accuracy while maintaining reasonable routing complexity through alternating patterns.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively balances detection signal offsets, reducing the 'whitening' or 'blackening' phenomenon, improving image quality and facilitating accurate medical imaging.
Implementation Method 1
a scintillation layer to convert X-rays into visible light
Implementation Method 2
a photosensitive element layer, the photosensitive element layer includes a plurality of photodiodes
Data Source
AI summary
An X-ray detecting panel and a method of operating the same, and an x-ray detecting device are provided. The X-ray detecting panel includes an array substrate which includes a plurality of gate lines and a plurality of signal lines intersecting with each other to divide the array substrate into a plurality of photosensitive cells, each of which comprises a thin film transistor, and the plurality of photosensitive cells comprises one or more first photosensitive cells and one or more second photosensitive cells, the thin film transistor of the first photosensitive cell is disposed at a first side of the first photosensitive cell, the thin film transistor of the second photosensitive cell is disposed at a second side of the second photosensitive cell, and the first side is opposite to the second side.


