X-ray Phase Imaging via Electromagnetic Beam Scanning
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Solution Overview
Problem
Conventional X-ray imaging methods, particularly phase contrast imaging, require mechanical movements of large grating objects at a sub-micron level, which is slow and difficult to reproduce precisely, and also involve mechanical instability and high costs due to the need for precision motors on moving gantries, while scattering degrades image quality and requires additional mechanical adjustments.
Innovation Solution
The implementation of an X-ray imaging system that uses a scanned X-ray beam and a fringe generator with diffraction gratings or absorption grids to produce modulated fringe patterns without mechanical movement, allowing for the alignment of electronic images to form high-quality phase or combined amplitude and phase images using a scan controller and image processor.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If mechanical phase stepping is used to obtain differential phase images, then quantitative phase retrieval is achieved, but the process becomes slow and mechanically unstable
Solution Approach 1:
The patent replaces the mechanical phase stepping system with an electromagnetic fringe scanning system. Instead of physically moving gratings using precision motors, the invention uses electromagnetic fields to scan the X-ray beam through the fringe pattern, achieving phase information extraction without mechanical movement. This substitution eliminates the time consumption and instability associated with mechanical phase stepping while maintaining quantitative phase retrieval accuracy.
Solution Approach 2:
The patent introduces an electromagnetic field as an intermediary between the X-ray source and the detector. By using electromagnetic fringe scanning, the system mediates the interaction between X-rays and the specimen through a controlled electromagnetic field that modulates the X-ray beam intensity according to the fringe pattern, enabling phase information extraction without direct mechanical manipulation of the gratings.
2Manufacturing precision
If precision motors are mounted on moving gantries for grating movement, then sub-micron level positioning is achieved, but mechanical instability and complexity increase
Solution Approach 1:
The patent eliminates the need for precision motors and mechanical gantries by substituting the mechanical positioning system with an electromagnetic fringe scanning system. The X-ray beam is scanned through the fixed fringes using electromagnetic fields, achieving the same sub-micron level positioning precision without the mechanical complexity and instability of motor-driven grating movement.
Solution Approach 2:
Instead of moving the gratings through the X-ray beam using precision motors, the patent inverts the approach by keeping the gratings stationary and scanning the X-ray beam through them using electromagnetic fields. This inversion eliminates the need for mechanical positioning systems while achieving the same measurement precision.
3Object-affected harmful factors
If absorption grids are mechanically moved to remove grid patterns, then scatter-corrected images are obtained, but the process becomes slow and requires maintenance
Solution Approach 1:
The patent replaces the mechanical movement of absorption grids with electromagnetic fringe scanning. The X-ray beam is scanned through the stationary absorption grids, and the resulting modulated fringe patterns are processed to obtain scatter-corrected images. This eliminates the need for mechanical actuators and their associated maintenance requirements while achieving the same scatter correction effect.
Solution Approach 2:
The patent uses electromagnetic fields as an intermediary to scan the X-ray beam through the absorption grids. This electromagnetic scanning mechanism mediates the interaction between the X-rays and the grids, enabling scatter correction without direct mechanical movement of the grids themselves.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach eliminates the need for mechanical movements, enhances image quality by reducing scattering effects, and provides stable and precise image formation with reduced costs and complexity, enabling superior contrast and detail in X-ray imaging.
Implementation Method 1
a coil coupled to scan the scannable X-ray beam based on a current applied to the coil
Implementation Method 2
A plurality of diffraction gratings or absorption grids is situated to receive the scannable X-ray beam, direct at least a portion of the scannable X-ray beam to a specimen, and produce X-ray fringes modulated by the specimen
Data Source
AI summary
X-ray grating based and grid based imagers formed a fringe pattern modulated by a specimen. An X-ray beam is scanned so that the fringe pattern is modulated by these specimen along a plurality of projection directions. Corresponding fringe patterns are detected and aligned so as to produce a specimen phase image. X-ray beam scanning is based on electric or magnetic deflection of an electron beam to an X-ray generating target.