X-ray Phase Imaging Grating Position Stabilization

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Solution Overview

Problem

The existing X-ray phase image capturing systems using Talbot interferometers face issues with image quality deterioration due to positional deviations other than translational movements, thermal deformations, and focal point deviations, especially when the grating period is miniaturized, leading to changes in the waveform of intensity changes and reduced phase sensitivity.

Innovation Solution

The system performs fringe scanning multiple times in a short time to minimize the impact of thermal deformations and focal point movements, extracting feature quantities such as amplitude, average pixel value intensity, and phase to generate phase-contrast images, thereby stabilizing the relative position between gratings and improving image quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the grating period is miniaturized to improve resolution, then the image detail capability is improved, but the system becomes more sensitive to positional deviations causing waveform changes and image quality deterioration

Engineering Contradiction:
Improvegrating period miniaturizationVSAvoidimage quality stability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies feedback by measuring the actual waveform of intensity changes during fringe scanning and using this information to correct positional deviations. The system monitors the waveform characteristics and adjusts the grating positions to maintain the expected waveform pattern, thereby compensating for thermal deformations and focal point deviations that become more critical with miniaturized grating periods

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent changes the scanning time parameter by performing fringe scanning multiple times in a short time period. This parameter modification reduces the cumulative effect of thermal deformations and focal point movements during the scanning process, maintaining waveform stability even with miniaturized gratings

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If fringe scanning is performed for a long time to improve measurement accuracy, then the phase sensitivity is improved, but thermal deformations and focal point deviations cause waveform changes and image quality deterioration

Engineering Contradiction:
Improvephase sensitivityVSAvoidscanning time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent implements periodic action by performing fringe scanning multiple times in a short time period rather than a single long scan. This periodic approach captures multiple waveforms quickly, reducing the impact of thermal deformations and focal point deviations that occur over time, while still achieving high phase sensitivity through statistical processing of multiple measurements

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent maintains continuity of useful action by performing multiple fringe scans in rapid succession without interruption. This continuous measurement approach ensures that phase sensitivity is maintained while minimizing the time window for thermal deformations and focal point deviations to affect the waveform

Inventive Principle:
Principle #20Continuity of useful action

3Device complexity

If the relative position between gratings is not stabilized, then the system complexity is reduced, but positional deviations cause waveform changes and phase sensitivity deterioration

Engineering Contradiction:
Improvegrating position controlVSAvoidphase sensitivity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent uses feedback to maintain high phase sensitivity without requiring complex mechanical stabilization systems. By measuring the actual waveform and detecting deviations from the expected pattern, the system electronically compensates for positional variations, achieving high measurement precision while keeping the mechanical control system relatively simple

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent applies self-service by using the interference pattern itself as the reference for detecting positional deviations. The waveform of intensity changes provides self-diagnostic information about grating position accuracy, allowing the system to self-correct without external intervention or complex stabilization mechanisms

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively suppresses image quality deterioration by shortening scanning time, reducing the effect of thermal fluctuations, and enhancing phase sensitivity, resulting in improved phase-contrast image quality even with miniaturized grating periods.

Implementation Method 1

a phase-contrast image is generated based on a waveform of an intensity change of a pixel value of each pixel of a Moire fringe imaged while translating a phase grating or an absorption grating by at least one period of the grating in a direction perpendicular to the grating pattern

Methodology Applied
Scientific EffectTalbot effect:

Implementation Method 2

imaging is performed using a phase grating and an absorption grating. Specifically, the imaging is performed a plurality of times while translating one of a plurality of gratings in a direction perpendicular to the grating pattern

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS11175241B2X-ray phase image capturing system
Publication Date: 2021.11.16 SHIMADZU CORP
  • US11175241B2 patent drawing
  • US11175241B2 patent drawing
  • US11175241B2 patent drawing

AI summary

This X-ray phase image capturing system (100) includes an X-ray source (1), a plurality of gratings, and a detector (4), a moving mechanism (8), and an image processing unit (5). The image processing unit (5) is configured to generate a phase-contrast image (15) based on a plurality of feature quantities (12) and feature quantities 14 extracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.