Sample Mounting System for X-ray Analysis
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Solution Overview
Problem
X-ray analysis apparatuses face errors due to sample misplacement, which affects the accuracy of material characterization, especially in X-ray diffraction analysis, where slight displacements lead to shifted diffraction peaks and incorrect sample characterization.
Innovation Solution
A sample mounting system with a sample holder and stage featuring aligned reference portions that engage to ensure repeatable and accurate positioning of the sample, allowing for precise orientation and rotation, thereby preventing inaccuracies in measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual sample placement is used, then operator flexibility is maintained, but sample positioning accuracy deteriorates due to misplacement errors
Solution Approach 1:
Reference portions are introduced as intermediary elements between the sample holder and sample stage. These reference portions engage with each other to provide a mechanical intermediary system that automatically ensures accurate sample positioning without requiring manual alignment by the operator, thus resolving the contradiction between positioning accuracy and operational flexibility
Solution Approach 2:
The sample holder and sample stage are designed to self-align through the engagement of their respective reference portions. When the sample holder is placed on the sample stage, the reference portions automatically engage to establish the correct aligned configuration, eliminating the need for operator intervention in the alignment process while maintaining ease of operation
2Reliability
If repeatable sample placement is implemented through reference portions, then measurement reliability is improved, but device complexity increases
Solution Approach 1:
The alignment function is segmented into separate reference portions on the sample holder and sample stage. This segmentation allows each component to maintain its primary function while adding the alignment capability through dedicated reference portions, rather than redesigning the entire system, thus minimizing the increase in device complexity while improving measurement reliability
Solution Approach 2:
The reference portions serve multiple functions: they provide alignment references, enable repeatable positioning, and ensure proper orientation of the sample holder on the sample stage. This multi-functionality reduces the need for separate alignment mechanisms, thereby limiting the increase in device complexity while achieving improved measurement reliability
Data Source
AI summary
The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.