X-ray Scan Parameter Definition for Single Crystal Anomaly Detection
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Solution Overview
Problem
Existing methods for detecting anomalies in single crystal structures, such as those in aircraft engine components, are slow and labor-intensive, relying heavily on operator skill and using subjective comparison of x-ray diffraction patterns.
Innovation Solution
A method is developed to define optimal scan parameters for x-ray scans by determining target orientations and adjusting x-ray exposure levels based on the structure's material characteristics, ensuring that x-rays are directed effectively to the structure, thereby improving the accuracy and speed of anomaly detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional x-ray scan methods are used with uniform exposure levels and fixed scan areas, then the inspection process is simple to implement, but the detection accuracy and speed are reduced due to insufficient optimization of x-ray exposure for different structural regions
Solution Approach 1:
The patent applies local quality by defining different non-zero levels of x-ray exposure for different parts of the scan area based on the target orientation and characteristics of the structure. This means that rather than using a uniform exposure level across the entire scan area, the system tailors the exposure level to specific regions, optimizing the detection accuracy for each local area while accounting for variations in material characteristics and orientation.
Solution Approach 2:
The patent implements dynamics by making the scan parameters adaptive rather than fixed. The scan area and exposure levels are dynamically defined based on the determined target orientation and structural characteristics. This allows the inspection system to adapt to different crystallographic orientations and structural features, improving detection accuracy without requiring manual reconfiguration for each inspection scenario.
2Reliability
If comprehensive scans covering large scan areas are performed to ensure complete coverage of the structure, then detection reliability is improved, but the inspection time increases significantly
Solution Approach 1:
The patent applies the taking out principle by extracting and focusing the x-ray scan specifically on the relevant scan area defined by the target orientation and structural characteristics. Rather than performing comprehensive scans of entire components or large areas, the system identifies and scans only the necessary regions where anomalies are most likely to occur or where the crystallographic orientation requires inspection, thereby reducing inspection time while maintaining reliability.
Solution Approach 2:
The patent implements partial action by performing scans only on the defined scan area rather than exhaustive scanning of all possible regions. The scan parameters are optimized to cover precisely what is needed for reliable defect detection based on the target orientation, avoiding unnecessary scanning of areas that would not contribute to anomaly detection, thus reducing cycle time without compromising reliability.
3Adaptability or versatility
If manual operator skill is relied upon to interpret x-ray diffraction patterns and identify anomalies, then flexibility in handling diverse defect types is maintained, but the inspection process becomes labor-intensive and subjective
Solution Approach 1:
The patent applies mechanics substitution by replacing the manual, subjective interpretation process with an automated computational method. Instead of relying on operators to visually inspect and interpret x-ray diffraction patterns, the system uses a computer to automatically compare the obtained diffraction pattern with a simulated pattern and objectively determine whether anomalies are present. This substitution dramatically increases productivity while maintaining the ability to handle diverse defect types through algorithmic analysis.
Solution Approach 2:
The patent implements self-service by enabling the inspection system to automatically perform the anomaly detection function without requiring manual intervention for pattern interpretation. The computer system autonomously compares experimental diffraction data with simulated patterns, identifies deviations, and determines the presence of anomalies, thereby eliminating the need for labor-intensive manual inspection while maintaining versatility in detecting various defect types.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for more precise and efficient detection of defects in single crystal structures by optimizing x-ray exposure and scan area definition, reducing cycle time and reliance on operator skill, and enhancing the reliability of anomaly identification.
Implementation Method 1
x-ray diffraction to detect subsurface crystallographic structures
Data Source
AI summary
A method of defining at least one scan parameter for an x-ray scan of a single crystal structure, the method comprising: determining a target orientation of the structure for the scan; and defining different non-zero levels of x-ray exposure for different parts of a scan area based on either or both of the target orientation and characteristics of the structure; and, defining the scan area so that substantially all x-rays of the scan are directed to the structure in the target orientation.