2D X-ray Scanner with Moving Aperture for Fast Imaging
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Solution Overview
Problem
Conventional X-ray imaging systems struggle to acquire wide field-of-view backscatter images of stationary objects efficiently without rotating the entire X-ray source, which is slow and mechanically challenging, especially for high-power sources and fast image frame acquisition requirements.
Innovation Solution
A two-dimensional X-ray scanner comprising a beam focuser, beam steerer, and a moving aperture that scans an electron beam along an X-ray production target, maintaining a predefined take-off angle, allowing the X-ray beam to be swept across the object in two dimensions without rotating the source, using a combination of fixed and rotating slits within a chopper wheel.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the entire X-ray source is rotated to sweep the beam plane across the object, then the field of view is increased, but the image acquisition speed decreases and mechanical complexity increases
Solution Approach 1:
The patent divides the beam sweeping function into two independent parts: (1) an electron beam scanner that rapidly scans the electron beam across the target to generate X-rays at different positions, and (2) a moving aperture that travels perpendicular to the beam path to select and collimate X-rays from different take-off angles. This segmentation allows each component to operate independently at optimal speeds, achieving wide field of view without rotating the entire source.
Solution Approach 2:
The patent introduces a new dimension of motion by moving the aperture perpendicular to the electron beam scan direction. While the electron beam scans in one dimension across the target, the aperture moves in a perpendicular dimension, creating a two-dimensional sampling of X-ray take-off angles. This dimensional approach enables wide field of view coverage without requiring rotation of the X-ray source.
2Area of stationary object
If the entire X-ray source is rotated to sweep the beam plane, then the field of view is increased, but the device complexity and mechanical challenges increase
Solution Approach 1:
The system separates the X-ray generation function (electron beam scanning across target) from the beam shaping function (aperture movement). The electron beam scanner uses electromagnetic deflection for rapid, contactless scanning, while the aperture uses simple linear translation. This segmentation eliminates the need for complex rotational mechanisms and reduces overall device complexity.
Solution Approach 2:
The patent replaces mechanical rotation of the X-ray source with electromagnetic beam scanning. The electron beam is deflected using electromagnetic fields to scan across the target rapidly, eliminating the need for mechanical rotation of the entire source assembly. This substitution reduces mechanical complexity and enables faster operation.
3Productivity
If a stationary aperture is used with electron beam scanning, then the line rate increases, but the field of view remains limited
Solution Approach 1:
The patent makes the aperture dynamic by moving it perpendicular to the electron beam scan direction. This dynamic aperture movement allows the system to sample X-rays from different take-off angles during the beam scan, effectively increasing the field of view while maintaining the high line rate achieved by electronic beam scanning.
Solution Approach 2:
The system maintains continuous operation by coordinating the electron beam scan and aperture movement simultaneously. Both components operate continuously during image acquisition, with the beam scanning across the target while the aperture moves to select different angles, maximizing the utilization of both mechanisms and maintaining high productivity throughout the process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables fast two-dimensional image acquisition with multiple frames per second, increasing the field of view by a factor of three or more, suitable for applications requiring high precision and compactness, such as aircraft inspection and medical imaging, without the need for source rotation.
Implementation Method 1
a beam focuser and beam steerer for scanning an electron beam on a path along an X-ray production target
Implementation Method 2
X-rays emitted by the X-ray production target
Implementation Method 3
an aperture adapted for travel in an aperture travel path relative to X-rays emitted by the X-ray production target
Data Source
AI summary
A two-dimensional X-ray scanner that includes a beam steerer for steering an electron beam to impinge upon a target; and a collimator further including an aperture adapted for travel in an aperture travel path for rotating the X-ray beam plane spanned by the electron beam impinging upon the target along a focal track for emitting a scanning X-ray beam.