Scanning X-ray Inspection with Dynamic Photon Counting and Integration

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Solution Overview

Problem

Conventional X-ray inspection systems face challenges with poor resolution, high noise content, and difficulty in accurately detecting low-Z materials concealed behind high-Z materials due to inadequate light collection methods and photon integration, leading to blurred images and rapid changes in X-ray intensity.

Innovation Solution

The system employs a scanning X-ray inspection method using a flying-spot pencil beam that oscillates across the object, combining forward and backscatter detectors with scintillation detection, and simultaneously operates in photon counting and integrating modes to generate clear, high-resolution images by determining the effective atomic number (Zeff) of materials through a preselected mapping.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If photon integration is used in conventional signal generation and processing, then advantages are afforded at high X-ray rates, but noisy images result, particularly in cases where the transmitted or scattered X-ray rates are relatively small

Engineering Contradiction:
ImproveX-ray processing rateVSAvoidimage quality
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The system dynamically adapts its detection mode based on real-time X-ray rate conditions. Photon counting mode is employed when X-ray rates are low to maintain image quality, while photon integration mode is used when X-ray rates are high to maximize processing throughput. This dynamic switching resolves the contradiction by optimizing both image quality and productivity according to operating conditions.

Inventive Principle:
Principle #15Dynamics

2Ease of manufacture

If relatively slow phosphors are used in X-ray detectors, then detection is achieved, but undesirably blurred images result owing to the slow response time of the excited phosphor

Engineering Contradiction:
Improvedetector implementationVSAvoidimage resolution
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The invention changes the temporal response parameter of the detection system by using fast-response photodetectors with rise times of 10 nanoseconds or less, replacing conventional slow phosphor-based detectors. This parameter change enables the system to resolve the contradiction between ease of manufacture and image resolution by achieving high-speed detection that produces sharp, non-blurred images while remaining practically implementable.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If conventional light collection methods are used in converting X-ray photons to light photons, then detection is achieved, but poor resolution results

Engineering Contradiction:
Improvedetection system implementationVSAvoidspatial resolution
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The invention replaces conventional mechanical/optical light collection methods with an electric field-based collection mechanism using photodetectors that directly convert light photons to electrical signals. This substitution eliminates the resolution-degrading effects of optical diffusion and mechanical light guide limitations, achieving both ease of manufacture and high spatial resolution simultaneously.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Measurement precision

If the object is scanned from all sides using two or more X-ray sources or computed tomography, then the material overlaying problem is overcome, but device complexity increases

Engineering Contradiction:
Improvematerial identification accuracyVSAvoidscanning system configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention introduces Compton scattered radiation detection as an intermediary measurement mechanism that provides material composition information without requiring multi-angle scanning or tomography. By detecting the energy and angular distribution of scattered photons, the system achieves accurate material identification (distinguishing low-Z from high-Z materials) using a single X-ray source and detector configuration, thereby resolving the contradiction between measurement precision and device complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in improved image quality with higher resolution and reduced noise, enabling effective detection of contraband such as bombs, firearms, and narcotics by accurately distinguishing between different materials and their overlays.

Implementation Method 1

scintillation detection with simultaneous counting and integrating modes

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 2

a photodetector, such as a photomultiplier tube, that converts the light photons to electrical signals

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 3

Compton scattering causes the incoming photon to lose some fraction of its energy and to be re-emitted, or scattered, in a direction away from the incident direction

Methodology Applied
Scientific EffectCompton scattering: Compton Scattering

Data Source

PatentUS7965816B2Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes
Publication Date: 2011.06.21 CONTROL SCREENING
  • US7965816B2 patent drawing
  • US7965816B2 patent drawing
  • US7965816B2 patent drawing

AI summary

X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Scatter and transmission images of the object are displayed, at least one being colorized in accordance with the effective atomic number of constituents of the object. Soft switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.