X-ray Scattering Analysis Device Using Primitive Structure Parameter Extraction
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Solution Overview
Problem
Existing measurement technologies using transmission-type incineration X-ray scattering technology face challenges in reducing the time required to analyze the distribution of X-ray scattering intensities, particularly when dealing with complex structures represented by a large number of meshes.
Innovation Solution
An interpretation device and method that extract parameters from mesh data representing a target structure, allowing for the calculation of an analytical solution for the scattering intensity distribution of X-rays irradiated to each primitive structure, thereby reducing the time needed for analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If transmission-type incineration X-ray scattering technology is used to analyze complex structures, then measurement capability is provided, but analysis time becomes excessively long
Solution Approach 1:
The patent divides the complex target structure into multiple primitive structures (spheres, cylinders, plates) based on electron density distribution. Each primitive structure is processed separately with analytical formulas, and the results are combined to obtain the total scattering intensity distribution. This segmentation reduces computational complexity and analysis time while maintaining measurement accuracy.
Solution Approach 2:
The patent transforms the problem from direct numerical integration of complex mesh data into parameter extraction and analytical calculation. By representing structures in terms of primitive geometric parameters (radius, height, area, volume) and using analytical formulas for scattering intensity, the computation time is dramatically reduced compared to direct numerical methods.
2Manufacturing precision
If mesh data with many elements is used to represent complex structures, then structural representation accuracy is improved, but calculation complexity increases
Solution Approach 1:
The patent merges meshes with identical electron density values into single primitive structures. Multiple meshes representing the same material composition are combined into one representative primitive structure (sphere, cylinder, or plate), reducing the number of separate calculations needed while preserving the accuracy of the electron density representation.
Solution Approach 2:
The patent extracts only the essential parameters (electron density, geometric dimensions) from the complex mesh data to create simplified primitive structure representations. This extraction retains the critical information needed for scattering intensity calculation while eliminating unnecessary computational complexity associated with detailed mesh geometry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed solution significantly reduces the time required to analyze the distribution of X-ray scattering intensities by up to 1592.4 times, while maintaining accurate results, by fusing meshes with the same electron density and using a reference electron density for calculation.
Implementation Method 1
calculate an analytical solution for a scattering intensity distribution of X-rays irradiated to each primitive structure based on the parameters, and to calculate a scattering intensity distribution of the X-rays irradiated to the target structure based on the parameters
Data Source
AI summary
An example interpretation device includes an extraction circuit and a calculation circuit. The extraction circuit is configured to extract, from mesh data representing a target structure, parameters of each primitive structure that consists of a plurality of meshes corresponding to the same electron density. The calculation circuit is configured to calculate an analytical solution for a scattering intensity distribution of X-rays irradiated to each primitive structure based on the parameters of each primitive structure, and to calculate a scattering intensity distribution of the X-rays irradiated to the target structure based on the parameters of each primitive structure.