Dual-mode X-ray Imaging System for Scattering Artifact Correction
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Solution Overview
Problem
Dark-field and phase-contrast X-ray imaging systems often suffer from artifacts due to scattering, which degrade image quality, especially in full-field imaging scenarios where scattering effects are more pronounced.
Innovation Solution
An X-ray imaging system configured to operate in two modes: object image acquisition and scattering measurement modes, utilizing a scattering measurement facilitator, such as an anti-scatter grid or interferometer, to reduce or prevent scattering artifacts by measuring and correcting for scattering data, allowing for accurate generation of dark-field and phase-contrast images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If full-field imaging is used to increase coverage area, then imaging area is improved, but scattering artifacts increase
Solution Approach 1:
The imaging process is segmented into two distinct modes: object image acquisition mode and scattering measurement mode. This segmentation allows the system to separately capture primary radiation images and scattered radiation images, which can then be processed to remove scattering artifacts while maintaining full-field imaging coverage.
Solution Approach 2:
A scattering measurement facilitator is introduced as an intermediary component between the X-ray source and detector. This facilitator enables the system to measure scattered radiation separately, acting as a mediator that allows the system to distinguish and correct scattering artifacts without limiting the full-field imaging capability.
2Measurement precision
If scattering measurement mode is used to reduce artifacts, then image quality is improved, but measurement time increases
Solution Approach 1:
The system merges the object image acquisition and scattering measurement into a unified dual-mode operation. By integrating both measurement capabilities into a single system with shared components, the overhead time for switching between modes is minimized, reducing the overall time penalty while maintaining high image quality through artifact correction.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively improves image quality by reducing scattering artifacts, enabling the acquisition of quantitatively correct dark-field and phase-contrast images even in large-scale, full-field imaging scenarios, maintaining signal integrity and enhancing contrast mechanisms.
Implementation Method 1
The scattering measurement facilitator comprises any one or more of: i) an anti-scatter grid
Implementation Method 2
The scattering measurement facilitator comprises at least a part of the interferometer
Implementation Method 3
The scattering measurement facilitator comprises a code aperture plate
Data Source
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AI summary
An X-ray imaging system (XI) configured for phase contrast and/or dark-field imaging. The system comprises an X-ray source (XS) operable to cause X-radiation to emanate from a focal spot (SF) of the source (XS) and an X-ray sensitive detector (D) operable to detect the X-radiation after interaction of said X-radiation with an object to be imaged, if present, between the X-ray source and the detector (D). A control logic (CL) is operable to cause the X-ray imaging apparatus to operate in any one of two modes, an object image acquisition mode and a scattering measurement mode. When in scattering measurement mode, the X-radiation receivable at the detector comprises a higher proportion of scattering radiation than in X-radiation receivable when the system is in object image acquisition mode.